{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:06:15Z","timestamp":1759147575018},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2009,2,1]],"date-time":"2009-02-01T00:00:00Z","timestamp":1233446400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2009,2]]},"DOI":"10.1109\/tcad.2008.2009163","type":"journal-article","created":{"date-parts":[[2009,1,20]],"date-time":"2009-01-20T21:03:22Z","timestamp":1232485402000},"page":"272-284","source":"Crossref","is-referenced-by-count":15,"title":["Accurate Rank Ordering of Error Candidates for Efficient HDL Design Debugging"],"prefix":"10.1109","volume":"28","author":[{"family":"Tai-Ying Jiang","sequence":"first","affiliation":[]},{"given":"C.-N.J.","family":"Liu","sequence":"additional","affiliation":[]},{"family":"Jing-Yang Jou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2001.902647"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966688"},{"key":"ref12","first-page":"58","article-title":"multiple design error diagnosis and correction","author":"veneris","year":"1999","journal-title":"Proc VLSI Test Symp"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2000.812646"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743310"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743298"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EURMIC.1999.794774"},{"key":"ref17","first-page":"iv-732","article-title":"an efficient approach for error diagnosis in hdl design","author":"shi","year":"2003","journal-title":"Proc Int Symp Circuits Syst"},{"key":"ref18","first-page":"290","article-title":"on debugging assistance in assertion-based verification","author":"huang","year":"2004","journal-title":"Proc 10th Workshop Synthesis Syst Integration Mixed Technol"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775927"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1990.129955"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1994.629736"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852031"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"503","DOI":"10.1145\/157485.165003","article-title":"diagnosis and correction of logic design errors in digital circuits","author":"chung","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.784125"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639713"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1990.129954"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217604"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2000.878324"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.5"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/43.936381"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181738"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1993.346062"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/4757328\/04757342.pdf?arnumber=4757342","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:00:34Z","timestamp":1633910434000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4757342\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,2]]},"references-count":24,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2008.2009163","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,2]]}}}