{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T05:35:29Z","timestamp":1770960929170,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2009,11,1]],"date-time":"2009-11-01T00:00:00Z","timestamp":1257033600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/tcad.2009.2030360","type":"journal-article","created":{"date-parts":[[2009,10,27]],"date-time":"2009-10-27T17:30:00Z","timestamp":1256664600000},"page":"1613-1626","source":"Crossref","is-referenced-by-count":9,"title":["A Methodology to Predict the Impact of Substrate Noise in Analog\/RF Systems"],"prefix":"10.1109","volume":"28","author":[{"given":"S.","family":"Bronckers","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Scheir","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Van der Plas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Vandersteen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Rolain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.827008"},{"key":"ref32","first-page":"1","article-title":"substrate noise isolation experiments in a 0.18 <ref_formula><tex notation=\"tex\">$\\mu\\hbox{m}$<\/tex><\/ref_formula> 1p6m triple-well cmos process on a lightly doped substrate","author":"vinella","year":"2007","journal-title":"Proc IEEE Instr Meas Tech Conf"},{"key":"ref31","first-page":"361","article-title":"analysis of substrate noise propagation in a lightly doped substrate [mixed-signal ics]","author":"van der plas","year":"2004","journal-title":"Proc 34th ESSDERC"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.847301"},{"key":"ref10","first-page":"422","article-title":"an esd-protected dc-to-6 ghz 9.7 mw lna in 90 nm digital cmos","author":"borremans","year":"2007","journal-title":"Proc Dig Tech Papers IEEE ISSCC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SMIC.2009.4770528"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364516"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547250"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2005.1489864"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2007.4449517"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/82.803483"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2002.1015074"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.315205"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"562","DOI":"10.1109\/JSSC.2004.825233","article-title":"a complete single-chip gps receiver with 1.6-v 24-mw radio in 0.18-<ref_formula><tex notation=\"tex\">$\\mu\\hbox{m}$ <\/tex><\/ref_formula> cmos","volume":"39","author":"kadoyama","year":"2004","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2003.811315"},{"key":"ref4","year":"0"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2003.1256944"},{"key":"ref3","year":"0"},{"key":"ref6","year":"0","journal-title":"Substrate Noise Analysis Cadence"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568710"},{"key":"ref5","year":"0","journal-title":"Spectre RF"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863191"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.886029"},{"key":"ref2","year":"0"},{"key":"ref9","first-page":"536","article-title":"a 400 <ref_formula><tex notation=\"tex\">$\\mu\\hbox{w}$<\/tex><\/ref_formula> 4.7-to-6.4 ghz vco under an above-ic inductor in 45 nm cmos","author":"borremans","year":"2008","journal-title":"Proc Dig Tech Papers IEEE ISSCC"},{"key":"ref1","year":"0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2007.282"},{"key":"ref22","article-title":"rf soc interaction with peripherals and the demand for attention to coupling effects in early design phases","author":"niehof","year":"2008","journal-title":"Proc WSD Workshop IEEE RFIC Symp"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541569"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.835810"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.858626"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/101.968913"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5290339\/05290343.pdf?arnumber=5290343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:27Z","timestamp":1633909947000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5290343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":33,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2009.2030360","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,11]]}}}