{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:10:02Z","timestamp":1740132602215,"version":"3.37.3"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/tcad.2010.2043593","type":"journal-article","created":{"date-parts":[[2010,5,28]],"date-time":"2010-05-28T12:56:22Z","timestamp":1275051382000},"page":"988-993","source":"Crossref","is-referenced-by-count":3,"title":["IR-Drop Management in FPGAs"],"prefix":"10.1109","volume":"29","author":[{"given":"Akhilesh","family":"Kumar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohab","family":"Anis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/DATE.2006.243995"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1007\/978-1-4615-5145-4"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1145\/329166.329208"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"75","DOI":"10.1145\/640000.640018","article-title":"partition driven standard cell thermal placement","author":"chen","year":"2003","journal-title":"Proc Int Symp Phys Design"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/43.828554"},{"year":"0","journal-title":"Predictive MOS Models","key":"ref15"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TED.2006.884077"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/ISQED.2005.64"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1002\/0471660302.ch7"},{"year":"0","author":"davis","journal-title":"The GNU Circuit Analysis Package Users Manual","key":"ref19"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TCAD.2006.870071"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TCAD.2005.846369"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/589411.589416"},{"key":"ref5","first-page":"35","article-title":"analysis of ir-drop scaling with implications for deep submicron p\/g network designs","author":"ajami","year":"2003","journal-title":"Proc Int Symp Quality Electron Design"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ISQED.2009.4810386"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ISQED.2005.114"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1145\/996566.996615"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCAD.2004.842802"},{"key":"ref9","first-page":"312","article-title":"a flexible power model for fpgas","author":"poon","year":"2002","journal-title":"Proc Conf Field Program Logic and Appl"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5467322\/05467333.pdf?arnumber=5467333","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:17:03Z","timestamp":1740129423000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5467333\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":19,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2010.2043593","relation":{},"ISSN":["0278-0070"],"issn-type":[{"type":"print","value":"0278-0070"}],"subject":[],"published":{"date-parts":[[2010,6]]}}}