{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,30]],"date-time":"2025-01-30T06:13:41Z","timestamp":1738217621704,"version":"3.34.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/tcad.2010.2048359","type":"journal-article","created":{"date-parts":[[2010,5,28]],"date-time":"2010-05-28T12:56:22Z","timestamp":1275051382000},"page":"966-976","source":"Crossref","is-referenced-by-count":9,"title":["A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost"],"prefix":"10.1109","volume":"29","author":[{"given":"Zhen","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Computer Science and Technology, Tsinghua University, Beijing, China"}]},{"given":"Dong","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Software, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref10","first-page":"438","article-title":"on structural versus functional testing for delay faults","author":"krstic","year":"2003","journal-title":"Proc Int Symp Quality Electron Design"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.915531"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.857379"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1059876.1059880"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.277638"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805824"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.85"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/92.311647"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.15"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.18"},{"key":"ref3","first-page":"666","article-title":"conflict-driven scan chain configuration for high transition fault coverage and low power","author":"chen","year":"2009","journal-title":"Proc IEEE\/Assoc Comput Machinery Asian South Pacific Design Autom Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.238614"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.251160"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532648"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030445"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268828"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583983"},{"key":"ref1","first-page":"187","article-title":"improving transition delay fault coverage using hybrid scan-based technique","author":"amhed","year":"2005","journal-title":"Proc 20th IEEE Int Symp Defect Fault-Tolerance Very Large Scale Integr Syst"},{"key":"ref20","first-page":"299","article-title":"a novel scan architecture for power efficient, rapid test","author":"sinanoglu","year":"2002","journal-title":"Proc Int Conf Comput -Aided Design"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855929"},{"key":"ref21","first-page":"1969","article-title":"hybrid delay scan: a low hardware overhead scan based delay test techniques for high fault coverage and compact test sets","author":"wang","year":"2004","journal-title":"Proc IEEE\/Assoc Comput Machinery Design Autom Test Eur"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1002"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1391962.1391972"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.61"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.14"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5467322\/05467329.pdf?arnumber=5467329","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,29]],"date-time":"2025-01-29T18:55:12Z","timestamp":1738176912000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5467329\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":27,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2010.2048359","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2010,6]]}}}