{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:12:11Z","timestamp":1747807931106},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2011,1]]},"DOI":"10.1109\/tcad.2010.2072670","type":"journal-article","created":{"date-parts":[[2010,12,22]],"date-time":"2010-12-22T01:24:58Z","timestamp":1292981098000},"page":"59-71","source":"Crossref","is-referenced-by-count":20,"title":["Bound-Based Statistically-Critical Path Extraction Under Process Variations"],"prefix":"10.1109","volume":"30","author":[{"given":"Lin","family":"Xie","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Azadeh","family":"Davoodi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837344"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837371"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"1924","DOI":"10.1109\/TCAD.2005.852674","article-title":"longest-path selection for delay test under process variation","volume":"24","author":"lu","year":"2005","journal-title":"IEEE Trans Comput -Aided Des Integr Circuits Syst"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681642"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.883924"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1348\/000711009X449771"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895797"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907047"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065604"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907241"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146929"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397287"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681574"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000252"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681573"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.17"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484830"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"676","DOI":"10.1145\/1391469.1391645","article-title":"efficient monte carlo based incremental statistical timing analysis","author":"veetil","year":"2008","journal-title":"2008 45th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560213"},{"key":"ref8","first-page":"405","article-title":"variation-aware performance verification using at-speed structural and statistical timing","author":"iyengar","year":"2007","journal-title":"Proc Int Conf Comput -Aided Des"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.835137"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012689"},{"key":"ref9","first-page":"37","article-title":"a statistical fault coverage metric for realistic path delay faults","author":"qiu","year":"2004","journal-title":"Proc VLSI Test Symp"},{"key":"ref1","first-page":"278","article-title":"bound-based identification of timing-violating paths under variability","author":"xie","year":"2009","journal-title":"Proc Asia South Pacific Des Autom Conf"},{"key":"ref20","author":"bertsekas","year":"2002","journal-title":"Introduction to Probability"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/66.1.147"},{"key":"ref21","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref24","first-page":"271","article-title":"statistical delay computation considering spatial correlations","author":"agarwal","year":"2003","journal-title":"Proc Asia South Pacific Des Autom Conf"},{"key":"ref23","year":"2008","journal-title":"Nangate 45 nm Open Cell Library"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1723112.1723132"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2009.4796490"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5671535\/05671544.pdf?arnumber=5671544","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:44:36Z","timestamp":1633913076000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5671544\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,1]]},"references-count":31,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2010.2072670","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,1]]}}}