{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T08:51:37Z","timestamp":1648630297960},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tcad.2010.2101750","type":"journal-article","created":{"date-parts":[[2011,4,21]],"date-time":"2011-04-21T15:11:58Z","timestamp":1303398718000},"page":"787-791","source":"Crossref","is-referenced-by-count":5,"title":["Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects"],"prefix":"10.1109","volume":"30","author":[{"given":"Xrysovalantis","family":"Kavousianos","sequence":"first","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"92","article-title":"A new ATPG algorithm to limit test set size and achieve multiple detections of all faults","author":"lee","year":"2002","journal-title":"Proc Design Autom Test Eur"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403528"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147186"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.87"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.330"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.110"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299221"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387330"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907228"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043591"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271073"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529894"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766675"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437649"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387328"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090833"},{"key":"ref20","year":"0","journal-title":"IWLS'05"},{"key":"ref21","author":"kavousianos","year":"0","journal-title":"Generation of compact single-detect stuck-at test sets targeting unmodeled defects"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5752406\/05752435.pdf?arnumber=5752435","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:52Z","timestamp":1633909612000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5752435\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":21,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2010.2101750","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}