{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:37:58Z","timestamp":1761647878497},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2011,8,1]],"date-time":"2011-08-01T00:00:00Z","timestamp":1312156800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2011,8]]},"DOI":"10.1109\/tcad.2011.2138470","type":"journal-article","created":{"date-parts":[[2011,7,21]],"date-time":"2011-07-21T15:11:42Z","timestamp":1311261102000},"page":"1253-1257","source":"Crossref","is-referenced-by-count":20,"title":["Generation of Multi-Cycle Broadside Tests"],"prefix":"10.1109","volume":"30","author":[{"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.860959"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907229"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1992.227840"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.251160"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.12"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.952743"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/775832.776000"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.298042"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1128","DOI":"10.1109\/43.406714","article-title":"Test application time reduction for sequential circuits with scan","volume":"14","author":"lee","year":"1995","journal-title":"IEEE Trans Comput -Aided Des"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437648"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469616"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1998.741614"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532648"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556969"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5956447\/05956871.pdf?arnumber=5956871","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:16Z","timestamp":1633909936000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5956871\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,8]]},"references-count":17,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2011.2138470","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,8]]}}}