{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T06:31:32Z","timestamp":1764225092749,"version":"3.34.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2011,11,1]],"date-time":"2011-11-01T00:00:00Z","timestamp":1320105600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2011,11,1]],"date-time":"2011-11-01T00:00:00Z","timestamp":1320105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2011,11,1]],"date-time":"2011-11-01T00:00:00Z","timestamp":1320105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2011,11]]},"DOI":"10.1109\/tcad.2011.2162237","type":"journal-article","created":{"date-parts":[[2011,10,18]],"date-time":"2011-10-18T15:27:30Z","timestamp":1318951650000},"page":"1762-1767","source":"Crossref","is-referenced-by-count":5,"title":["MVP: Minimum-Violations Partitioning for Reducing Capture Power in At-Speed Delay-Fault Testing"],"prefix":"10.1109","volume":"30","author":[{"given":"Zhen","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Computer Science and Technology, Tsinghua University, Beijing, China"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA"}]},{"given":"Dong","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Software, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.82"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484839"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/92.748202"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/BF02579324"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297694"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.829797"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref17","first-page":"1019","article-title":"Low-capture-power test generation for scan-based at-speed testing","author":"wen","year":"2005","journal-title":"Proc ITC"},{"key":"ref18","article-title":"Pattern-directed circuit virtual partitioning for test power reduction","author":"xu","year":"2007","journal-title":"Proc ITC"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060135"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386971"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268828"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.807890"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70794"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894260"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654124"},{"journal-title":"Introduction to Linear Optimization","year":"1997","author":"bertsimas","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2006091"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6046160\/06046167.pdf?arnumber=6046167","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,29]],"date-time":"2025-01-29T18:55:09Z","timestamp":1738176909000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6046167\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,11]]},"references-count":19,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2011.2162237","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2011,11]]}}}