{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:16:41Z","timestamp":1773656201925,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2012,7,1]],"date-time":"2012-07-01T00:00:00Z","timestamp":1341100800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2012,7]]},"DOI":"10.1109\/tcad.2012.2186298","type":"journal-article","created":{"date-parts":[[2012,6,14]],"date-time":"2012-06-14T19:37:17Z","timestamp":1339702637000},"page":"1102-1115","source":"Crossref","is-referenced-by-count":4,"title":["On Diagnosis of Timing Failures in Scan Architecture"],"prefix":"10.1109","volume":"31","author":[{"family":"Mingjing Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Orailoglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364644"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.896939"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.36"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.848800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.182"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2013984"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1297666.1297675"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/0031-3203(89)90045-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1137\/0806023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.83"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386946"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529892"},{"key":"ref8","first-page":"134","article-title":"On identifying and bypassing faulty scan segments","author":"tekumulla","year":"2007","journal-title":"Proc North Atlantic Test Workshop"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"ref2","first-page":"157","article-title":"Quick scan chain diagnosis using signal profiling","author":"yang","year":"2005","journal-title":"Proc ICCD"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"1861","DOI":"10.1109\/TCAD.2005.858267","article-title":"An algorithmic technique for diagnosis of faulty scan chains","volume":"25","author":"guo","year":"2006","journal-title":"IEEE Trans Comput -Aided Des"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313363"},{"key":"ref20","first-page":"436","article-title":"Diagnosis of defects on scan enable and clock trees","author":"huang","year":"2006","journal-title":"Proc DATE"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/58.3.509"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.59"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/74.1.85"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6218208\/06218221.pdf?arnumber=6218221","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:50:58Z","timestamp":1633909858000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6218221\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,7]]},"references-count":23,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2012.2186298","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,7]]}}}