{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T16:36:53Z","timestamp":1732034213832},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2012,8,1]],"date-time":"2012-08-01T00:00:00Z","timestamp":1343779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/tcad.2012.2189394","type":"journal-article","created":{"date-parts":[[2012,7,13]],"date-time":"2012-07-13T11:57:53Z","timestamp":1342180673000},"page":"1297-1302","source":"Crossref","is-referenced-by-count":6,"title":["Concurrent Generation of Concurrent Programs for Post-Silicon Validation"],"prefix":"10.1109","volume":"31","author":[{"given":"Allon","family":"Adir","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amir","family":"Nahir","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avi","family":"Ziv","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277900"},{"key":"ref11","first-page":"13","article-title":"Constraint-based random stimuli generation for hardware verification","volume":"28","author":"naveh","year":"2007","journal-title":"AI Mag"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1147\/sj.413.0386"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/71.242161"},{"key":"ref14","year":"1994","journal-title":"The PowerPC Architecture"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/OPNARC.2003.1196379"},{"key":"ref16","author":"adir","year":"2011","journal-title":"Concurrent Generation of Concurrent Programs for Post-Silicon Validation"},{"key":"ref17","first-page":"36","article-title":"Industrial experience with test generation languages gar processor verification","author":"behm","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2002.1224432"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2003.1199067"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/rd.461.0053"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675439"},{"key":"ref8","first-page":"1","article-title":"A unified methodology for pre-silicon verification and post-silicon validation","author":"adir","year":"2011","journal-title":"Proc Des Automat Test Eur Conf"},{"key":"ref7","author":"storm","year":"2006","journal-title":"Random Test Generators for Microprocessor Design Validation"},{"key":"ref2","year":"0","journal-title":"International Technology Roadmap for Semiconductors 2009 Edition Design"},{"key":"ref1","author":"wile","year":"2005","journal-title":"Comprehensive Functional Verification The Complete Industry Cycle"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2010.38"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6238386\/06238397.pdf?arnumber=6238397","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:54:06Z","timestamp":1633910046000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6238397\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":17,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2012.2189394","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,8]]}}}