{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,6,5]],"date-time":"2023-06-05T15:14:10Z","timestamp":1685978050883},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/tcad.2012.2193579","type":"journal-article","created":{"date-parts":[[2012,8,16]],"date-time":"2012-08-16T18:02:45Z","timestamp":1345140165000},"page":"1417-1427","source":"Crossref","is-referenced-by-count":15,"title":["$X$-Canceling MISR Architectures for Output Response Compaction With Unknown Values"],"prefix":"10.1109","volume":"31","author":[{"given":"Joon-Sung","family":"Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nur A.","family":"Touba","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197640"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012631"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.844111"},{"key":"ref13","first-page":"1","article-title":" $X$<\/tex><\/formula>-press compactor for 1000x reduction of test data","author":"rajski","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.48"},{"key":"ref15","first-page":"1","article-title":"$X$<\/tex><\/formula>-filter: Filtering unknowns from compacted test responses","author":"sharma","year":"2005","journal-title":"Proc Int Test Conf"},{"key":"ref16","first-page":"1","article-title":"$X$<\/tex><\/formula>-alignment techniques for improving the observability of response compactors","author":"sinanoglu","year":"2009","journal-title":"Proc Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863742"},{"key":"ref18","first-page":"1","article-title":"$X$<\/tex><\/formula>-canceling MISR: An $X$<\/tex> <\/formula>-tolerant methodology for compacting output responses with unknowns using a MISR","author":"touba","year":"2007","journal-title":"Proc Int Test Conf"},{"key":"ref19","first-page":"117","article-title":"Response compaction with any number of unknowns using a new LFSR architecture","author":"volkerink","year":"2005","journal-title":"Proc Des Automat Conf"},{"key":"ref4","author":"cullen","year":"1997","journal-title":"Linear Algebra With Applications"},{"key":"ref27","first-page":"1","article-title":"Industrial case study for $X$<\/tex><\/formula>-canceling MISR","author":"yang","year":"2009","journal-title":"Proc Int Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386981"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref5","first-page":"35","article-title":"Increasing output compaction in presence of unknowns using an $X$<\/tex><\/formula>-canceling MISR with deterministic observation","author":"garg","year":"2008","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5107-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560044"},{"key":"ref9","first-page":"432","article-title":"$X$<\/tex><\/formula>-tolerant signature analysis","author":"mitra","year":"2004","journal-title":"Proc Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref20","author":"wang","year":"2006","journal-title":"VLSI Test Principles and Architectures"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70833"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364563"},{"key":"ref24","first-page":"727","article-title":"$X$<\/tex><\/formula>-tolerant compression and application of scan-ATPG patterns in a BIST architecture","author":"wohl","year":"2003","journal-title":"Proc Int Test Conf"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966618"},{"key":"ref26","first-page":"362","article-title":"Fully $X$<\/tex><\/formula>-tolerant, very high scan compression","author":"wohl","year":"2010","journal-title":"Proc Des Automat Conf"},{"key":"ref25","first-page":"934","article-title":"Scalable selector architecture for $X$<\/tex><\/formula>-tolerant deterministic BIST","author":"wohl","year":"2004","journal-title":"Proc Des Automat Conf"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6269957\/06269976.pdf?arnumber=6269976","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,14]],"date-time":"2017-11-14T15:13:52Z","timestamp":1510672432000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6269976\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":27,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2012.2193579","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,9]]}}}