{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,3]],"date-time":"2026-10-03T23:42:28Z","timestamp":1791070948222,"version":"4.1.0"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2012,12,1]],"date-time":"2012-12-01T00:00:00Z","timestamp":1354320000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/tcad.2012.2209884","type":"journal-article","created":{"date-parts":[[2012,11,21]],"date-time":"2012-11-21T15:20:08Z","timestamp":1353511208000},"page":"1831-1844","source":"Crossref","is-referenced-by-count":33,"title":["Efficient SRAM Failure Rate Prediction via Gibbs Sampling"],"prefix":"10.1109","volume":"31","author":[{"given":"Shupeng","family":"Sun","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yamei","family":"Feng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Changdao","family":"Dong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630041"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687515"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654259"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref15","first-page":"754","article-title":"An efficient, fully nonlinear, variability-aware non-Monte-Carlo yield estimation procedure with applications to SRAM cells and ring oscillators","author":"gu","year":"2008","journal-title":"Proc Asia South Pacific Des Automat Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1023\/A:1020281327116"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177692644"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"386","DOI":"10.1145\/1629911.1630013","article-title":"efficient design-specific worst-case corner extraction for integrated circuits","author":"hong zhang","year":"2009","journal-title":"2009 46th ACM\/IEEE Design Automation Conference dac"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544365"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2007.911072"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382599"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146928"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382534"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391522"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.913744"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024769"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364490"},{"key":"ref20","author":"papoulis","year":"2001","journal-title":"Probability random variables and stochastic processes"},{"key":"ref22","author":"fishman","year":"2005","journal-title":"A First Course in Monte Carlo"},{"key":"ref21","author":"kendall","year":"2004","journal-title":"A Course in the Geometry of n Dimensions"},{"key":"ref23","author":"bishop","year":"2007","journal-title":"Pattern Recognition and Machine Learning"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6349425\/06349433.pdf?arnumber=6349433","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T19:51:07Z","timestamp":1633895467000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6349433\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":23,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2012.2209884","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,12]]}}}