{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:04:23Z","timestamp":1761581063115},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2013,3,1]],"date-time":"2013-03-01T00:00:00Z","timestamp":1362096000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/tcad.2012.2227258","type":"journal-article","created":{"date-parts":[[2013,2,14]],"date-time":"2013-02-14T19:03:37Z","timestamp":1360868617000},"page":"442-452","source":"Crossref","is-referenced-by-count":10,"title":["Generation of Functional Broadside Tests for Logic Blocks With Constrained Primary Input Sequences"],"prefix":"10.1109","volume":"32","author":[{"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"A study of implication based pseudo functional testing","author":"syal","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.915531"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457038"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763208"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998380"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.917424"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907229"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532648"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.12"},{"key":"ref4","first-page":"928","article-title":"On the generation of scan-based test sets with reachable states for testing under functional operation conditions","author":"pomeranz","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700586"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"398","DOI":"10.1109\/DFTVS.2005.49","article-title":"On generating pseudo-functional delay fault tests for scan designs","author":"zhang","year":"2005","journal-title":"Proc Int Symp Defect Fault-Tolerance Very-Large-Scale Integration Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2005.1466151"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1535","DOI":"10.1109\/TCAD.2005.857379","article-title":"Pseudofunctional testing","volume":"25","author":"lin","year":"2006","journal-title":"IEEE Trans Comput -Aided Design"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243927"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.860959"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/6461966\/06461987.pdf?arnumber=6461987","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:40:24Z","timestamp":1638218424000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6461987\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":19,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2012.2227258","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,3]]}}}