{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,22]],"date-time":"2026-09-22T07:27:44Z","timestamp":1790062064782,"version":"4.0.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2013,9,1]],"date-time":"2013-09-01T00:00:00Z","timestamp":1377993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/tcad.2013.2255128","type":"journal-article","created":{"date-parts":[[2013,8,16]],"date-time":"2013-08-16T18:02:08Z","timestamp":1376676128000},"page":"1383-1394","source":"Crossref","is-referenced-by-count":11,"title":["Adjustable RF Mixers' Alternate Test Efficiency Optimization by the Reduction of Test Observables"],"prefix":"10.1109","volume":"32","author":[{"given":"John","family":"Liaperdos","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Angela","family":"Arapoyanni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiorgos","family":"Tsiatouhas","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.119"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041873"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855835"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.895531"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1968.1054102"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.41"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/66.29679"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231074"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.853893"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2006.1651148"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541661"},{"key":"ref18","article-title":"Built-in test strategy for CMOS RF mixers","author":"suenaga","year":"2005","journal-title":"Proc DCIS Conf"},{"key":"ref19","first-page":"315","article-title":"Fault detection in RF mixers combining defect-oriented and alternate test strategies","author":"liaperdos","year":"2011","journal-title":"Proc DCIS Conf"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5689-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.31"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5725-8"},{"key":"ref3","first-page":"352","article-title":"Low-cost test of embedded RF\/analog\/mixed-signal circuits in SOPs","volume":"27","author":"akbay","year":"2004","journal-title":"IEEE Trans Computer-Aided Design Integr Circuits Syst"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090929"},{"key":"ref29","author":"maas","year":"1993","journal-title":"Microwave Mixers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.77"},{"key":"ref8","first-page":"43","article-title":"PPM-accuracy error estimates for low-lost analog test: A case study","author":"kupp","year":"2011","journal-title":"Proc 17th IEEE IMS3TW"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2008.09.008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref1","year":"0","journal-title":"SIA International Technology Roadmap for Semiconductors"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139144"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-012-9981-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2246903"},{"key":"ref24","author":"friedman","year":"1993","journal-title":"Fast MARS"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1111\/j.2517-6161.1974.tb00994.x","article-title":"Cross-validatory choice and assessment of statistical predictions","volume":"36","author":"stone","year":"1974","journal-title":"J Royal Stat Soc"},{"key":"ref26","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-21606-5","author":"hastie","year":"2001","journal-title":"The Elements of Statistical Learning"},{"key":"ref25","first-page":"235","article-title":"MARS: Still an alien planet in soft computing?","author":"abraham","year":"2001","journal-title":"Proc Computational Science ICCS"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6582559\/06582596.pdf?arnumber=6582596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T19:09:13Z","timestamp":1715886553000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6582596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":32,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2255128","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,9]]}}}