{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T00:04:49Z","timestamp":1772064289631,"version":"3.50.1"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2013,9,1]],"date-time":"2013-09-01T00:00:00Z","timestamp":1377993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/tcad.2013.2256394","type":"journal-article","created":{"date-parts":[[2013,8,16]],"date-time":"2013-08-16T18:02:08Z","timestamp":1376676128000},"page":"1369-1382","source":"Crossref","is-referenced-by-count":10,"title":["High-Quality Statistical Test Compression With Narrow ATE Interface"],"prefix":"10.1109","volume":"32","author":[{"given":"Vasileios","family":"Tenentes","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xrysovalantis","family":"Kavousianos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271095"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.47"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699274"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882509"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923111"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030445"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1952.273898"},{"key":"ref36","year":"2005"},{"key":"ref35","article-title":"On deploying scan chains for data storage in test compression environment","author":"tyszer","year":"2013","journal-title":"IEEE Des Test"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2126574"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1223641"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456928"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2002.1046192"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.844311"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2024116"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041776"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1044111.1044117"},{"key":"ref16","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"konemann","year":"1991","journal-title":"Proc ETC"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1027084.1027089"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831584"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364564"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885830"},{"key":"ref27","first-page":"1","article-title":"Concurrent core test for SOC using shared test set and scan chain disable","author":"zeng","year":"2006","journal-title":"Proc DATE"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811452"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923100"},{"key":"ref29","article-title":"How power-aware test improves reliability and yield","author":"shi","year":"2004","journal-title":"EE Times EDA News Online"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1057"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.807895"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.913754"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766654"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref46","doi-asserted-by":"crossref","first-page":"539","DOI":"10.1145\/1278480.1278617","article-title":"new test data decompressor for low power applications","author":"mrugalski","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1049\/el:19980150"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2009166"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378388"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.87"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.886417"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090833"},{"key":"ref24","first-page":"1","article-title":"Compression based on deterministic test vector clustering of incompatible test cubes","author":"czysz","year":"2009","journal-title":"Proc ITC"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907228"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035550"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1997.621566"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2051096"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2079961"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998303"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6582559\/06582565.pdf?arnumber=6582565","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:40:26Z","timestamp":1638218426000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6582565\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":48,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2256394","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,9]]}}}