{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T11:14:34Z","timestamp":1790853274398,"version":"4.1.0"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/tcad.2013.2263039","type":"journal-article","created":{"date-parts":[[2013,9,16]],"date-time":"2013-09-16T18:02:04Z","timestamp":1379354524000},"page":"1533-1545","source":"Crossref","is-referenced-by-count":159,"title":["Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos"],"prefix":"10.1109","volume":"32","author":[{"given":"Zheng","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tarek A.","family":"El-Moselhy","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ibrahim M.","family":"Elfadel","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luca","family":"Daniel","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15337-2_3"},{"key":"ref38","author":"pulch","year":"0"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/S0021-9991(03)00092-5"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1137\/S1064827501387826"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1137\/040615201"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-3094-6"},{"key":"ref37","article-title":"Stochastic collocation with least orthogonal interpolant Leja sequences","author":"narayan","year":"2013","journal-title":"Proc SIAM Conf Comput Sci Eng"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1137\/110854059"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s11044-006-9007-5"},{"key":"ref34","first-page":"242","article-title":"Fast numerical methods for stochastic computations: A review","volume":"5","author":"xiu","year":"2009","journal-title":"Commun Comput Phys"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1391978.1391981"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.2307\/2371268"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"947","DOI":"10.1109\/4.400439","article-title":"Limitation of CMOS supply-voltage scaling by MOSFET threshold-voltage variation","volume":"30","author":"sun","year":"1995","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913194"},{"key":"ref20","author":"tuinenga","year":"1995","journal-title":"SPICE A Guide to Circuit Simulation and Analysis using PSPICE"},{"key":"ref22","year":"0"},{"key":"ref21","year":"0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.2307\/2280232"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062750"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2020721"},{"key":"ref50","year":"0"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1017\/S0962492904000182"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105380"},{"key":"ref40","author":"xiu","year":"2010","journal-title":"Numerical Methods for Stochastic Computations A Spectral Method Approach"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826583"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746469"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996675"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/66.388016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2001.929760"},{"key":"ref16","first-page":"98","author":"boning","year":"2000","journal-title":"Design of High Performance Microprocessor Circuits"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061292"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862751"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2164536"},{"key":"ref4","first-page":"415","article-title":"Stochastic integral equation solver for efficient variation aware interconnect extraction","author":"moselhy","year":"2008","journal-title":"Proc Design Auto Conf"},{"key":"ref3","first-page":"50","article-title":"Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm","author":"tega","year":"2009","journal-title":"Proc IEEE Very Large Scale Integr (VLSI) Symp"},{"key":"ref6","first-page":"14","article-title":"Variation-aware stochastic extraction with large parameter dimensionality: Review and comparison of state of the art intrusive and non-intrusive techniques","author":"moselhy","year":"2011","journal-title":"Proc Int Symp Quality Electron Design"},{"key":"ref5","first-page":"667","article-title":"Stochastic dominant singular vectors method for variation-aware extraction","author":"moselhy","year":"2010","journal-title":"Proc Design Auto Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2192274"},{"key":"ref49","year":"1996","journal-title":"Star-HSPICE Users Manual"},{"key":"ref7","author":"el-moselhy","year":"2010","journal-title":"Field solver technologies for variation-aware interconnect parasitic extraction"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2171490"},{"key":"ref46","author":"kundert","year":"1995","journal-title":"The Designers Guide to SPICE and SPECTRE"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/43.97624"},{"key":"ref48","author":"weinzierl","year":"2000","journal-title":"Introduction to Monte Carlo methods NIKHEF"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/BF01990529"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-3520-2"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2011.2167935"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1137\/S1064827503424505"},{"key":"ref43","doi-asserted-by":"crossref","first-page":"504","DOI":"10.1109\/TCS.1975.1084079","article-title":"The modified nodal approach to network analysis","volume":"22","author":"ho","year":"1975","journal-title":"IEEE Trans Circuits Syst"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6600826\/06600994.pdf?arnumber=6600994","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,23]],"date-time":"2021-12-23T08:30:05Z","timestamp":1640248205000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6600994\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":51,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2263039","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}