{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,5]],"date-time":"2024-08-05T10:35:43Z","timestamp":1722854143180},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/tcad.2013.2266374","type":"journal-article","created":{"date-parts":[[2013,9,16]],"date-time":"2013-09-16T18:02:04Z","timestamp":1379354524000},"page":"1583-1594","source":"Crossref","is-referenced-by-count":7,"title":["Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects"],"prefix":"10.1109","volume":"32","author":[{"given":"Fang","family":"Bao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ke","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","author":"snyman","year":"2005","journal-title":"Practical Mathematical Optimization An Introduction to Basic Optimization Theory and Classical and New Gradient-Based Algorithms"},{"key":"ref30","first-page":"177","article-title":"Timing-aaware ATPG for hign quality at-speed testing of small delay defects","author":"lin","year":"2006","journal-title":"Proc IEEE Asian Test Symp"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355643"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699258"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.835137"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.28"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.30"},{"key":"ref15","first-page":"668","article-title":"Enhancing diagonsis resolution for delay defects based upon statistical timing and statistical fault models","author":"kristic","year":"2003","journal-title":"Proc ACM\/IEEE Design Autom Conf"},{"key":"ref16","year":"2010","journal-title":"Automation Test Pattern Generation Synopsys Datasheet"},{"key":"ref17","year":"2009","journal-title":"Advanced Automation Test Pattern Generation Silicon Test and Yield Analysis Datasheet"},{"key":"ref18","article-title":"Incremental small delay defect methodology","author":"cavenaghi","year":"2010","journal-title":"Proc Poster Session ACM\/IEEE Design Autom Conf"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.59"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.26"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147152"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783759"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278609"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.62"},{"key":"ref29","year":"0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837344"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783771"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.145"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1514932.1514973"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.37"},{"key":"ref1","article-title":"Layout practice impact on timing and yield","author":"boning","year":"2003","journal-title":"Proc IEEE 1st Int Symp Quality Electron Des"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.30"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197672"},{"key":"ref21","first-page":"224","article-title":"Diagnostic test generation for small delay defect diagnosis","author":"guo","year":"2010","journal-title":"Proc Int Symp Very Large Scale Integr Design Autom Test"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469619"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043591"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.63"},{"key":"ref25","first-page":"1426","article-title":"High-quality pattern selection for screening small-delay defects considering process variations and crosstalk","author":"peng","year":"2010","journal-title":"Proc Design Automation Test Europe Conf Exhibition"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6600826\/06601027.pdf?arnumber=6601027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:40:27Z","timestamp":1638218427000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6601027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":31,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2266374","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}