{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,8]],"date-time":"2026-06-08T13:32:05Z","timestamp":1780925525030,"version":"3.54.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2014,2,1]],"date-time":"2014-02-01T00:00:00Z","timestamp":1391212800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2014,2]]},"DOI":"10.1109\/tcad.2013.2287184","type":"journal-article","created":{"date-parts":[[2014,1,24]],"date-time":"2014-01-24T20:13:52Z","timestamp":1390594432000},"page":"279-290","source":"Crossref","is-referenced-by-count":56,"title":["Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning"],"prefix":"10.1109","volume":"33","author":[{"given":"Fangming","family":"Ye","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhaobo","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2009.5459179"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3969\/j.issn.1004-4132.2011.04.021"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569364"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386948"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.23"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/cp:19950202"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1613\/jair.462"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(99)00034-X"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469569"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139139"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233029"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583974"},{"key":"ref19","first-page":"181","article-title":"Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?","author":"parker","year":"2003","journal-title":"Proc IEEE ITC"},{"key":"ref28","year":"0","journal-title":"Incremental SVM Learning with Multiclass Support and Probabilistic Output"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584042"},{"key":"ref27","first-page":"1344","article-title":"Large scale classification with local diversity AdaBoost SVM algorithm","volume":"20","author":"chang","year":"2009","journal-title":"J Syst Eng Electron"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437663"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2182984"},{"key":"ref29","author":"canu","year":"2005","journal-title":"SVM and Kernel methods matlab toolbox"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583992"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401571"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/5326.971655"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297650"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583975"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297631"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1093\/bioinformatics\/bth294"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1553374.1553510"},{"key":"ref24","first-page":"219","article-title":"Support vector machines for multi-class pattern recognition","volume":"4","author":"weston","year":"1999","journal-title":"Proc 7th Eur Symp Artif Neur Netw"},{"key":"ref23","first-page":"40","article-title":"Economic designs for manufacturing system test and field maintenance","author":"lin","year":"2005","journal-title":"Proc Symp Syst Theory"},{"key":"ref26","first-page":"2491","article-title":"SimpleMKL","volume":"9","author":"rakotomamonjy","year":"2008","journal-title":"J Mach Learn Res"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"1055","DOI":"10.1109\/72.788646","article-title":"Support vector machines for histogram-based image classification","volume":"10","author":"chapelle","year":"1999","journal-title":"IEEE Trans Neur Netw"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6714471\/06714627.pdf?arnumber=6714627","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:32Z","timestamp":1642005092000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6714627\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,2]]},"references-count":32,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2287184","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,2]]}}}