{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,26]],"date-time":"2025-09-26T13:23:43Z","timestamp":1758893023275},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2014,3,1]],"date-time":"2014-03-01T00:00:00Z","timestamp":1393632000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/tcad.2013.2288688","type":"journal-article","created":{"date-parts":[[2014,2,13]],"date-time":"2014-02-13T19:18:37Z","timestamp":1392319117000},"page":"451-463","source":"Crossref","is-referenced-by-count":9,"title":["Pre-Silicon Bug Forecast"],"prefix":"10.1109","volume":"33","author":[{"given":"Qi","family":"Guo","sequence":"first","affiliation":[]},{"given":"Tianshi","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Yunji","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Rui","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Huanhuan","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Weiwu","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Guoliang","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","author":"witten","year":"2005","journal-title":"Data Mining Practical Machine Learning Tools and Techniques"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884494"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/1083142.1083147"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/505282.505283"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368135"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985860"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2440-0"},{"key":"ref36","first-page":"935","article-title":"Experimental perspectives on learning from imbalanced data","author":"van hulse","year":"0","journal-title":"Proc 24th ICML'07"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1370750.1370761"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217611"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2011.24"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1996.8.7.1341"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1557019.1557143"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146996"},{"key":"ref15","author":"goldberg","year":"1989","journal-title":"Genetic Algorithms in Search Optimization and Machine Learning"},{"key":"ref16","first-page":"623","article-title":"Estimating design quality of digital systems via machine learning","author":"guo","year":"0","journal-title":"Proc 17th ICECS'10"},{"key":"ref17","first-page":"161","article-title":"Empirical design bugs prediction for verification","author":"guo","year":"0","journal-title":"Proc DATE'11"},{"key":"ref18","first-page":"359","article-title":"Correlation-based feature selection for discrete and numeric class machine learning","author":"hall","year":"0","journal-title":"Proc 17th ICML'00"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838876"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.935512"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2005.1553571"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2005.37"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref29","first-page":"343","article-title":"Learning with continuous classes","author":"quinlan","year":"1992","journal-title":"Proc Australian Joint Conf Artificial Intell"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025119"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2047414.2047423"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1961189.1961199"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3115\/1073012.1073017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771798"},{"key":"ref1","author":"lewis","year":"2013"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227193"},{"key":"ref22","first-page":"119","article-title":"Transparent combination of expert and measurement data for defect prediction: An industrial case study","author":"kl\ufffds","year":"0","journal-title":"Proc 32nd ICSE'10"},{"key":"ref21","first-page":"489","article-title":"Predicting faults from cached history","author":"kim","year":"0","journal-title":"Proc 29th ICSE'07"},{"key":"ref42","first-page":"91","article-title":"Cross-project defect prediction: A large scale experiment on data versus domain versus process","author":"zimmermann","year":"0","journal-title":"Proc of ESEC\/FSE'09"},{"key":"ref24","author":"manning","year":"1999","journal-title":"Foundations of Statistical Natural Language Processing"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.102"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2002.1224435"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368114"},{"key":"ref25","author":"mitchell","year":"1997","journal-title":"Machine Learning"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6740003\/06740024.pdf?arnumber=6740024","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:33Z","timestamp":1642005093000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6740024\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":42,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2288688","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,3]]}}}