{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T09:26:26Z","timestamp":1706779586247},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2014,3,1]],"date-time":"2014-03-01T00:00:00Z","timestamp":1393632000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/tcad.2013.2292504","type":"journal-article","created":{"date-parts":[[2014,2,13]],"date-time":"2014-02-13T19:18:37Z","timestamp":1392319117000},"page":"384-396","source":"Crossref","is-referenced-by-count":18,"title":["Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions"],"prefix":"10.1109","volume":"33","author":[{"given":"Jian","family":"Yao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zuochang","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yan","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","author":"cai","year":"2005","journal-title":"Importance Sampling in Monte Carlo Simulation of Rare Transition Events"},{"key":"ref32","author":"boor","year":"2001","journal-title":"A practical Guide to Splines"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"1543","DOI":"10.1109\/TSMCB.2010.2042955","article-title":"Face transformation with harmonic models by the finite-volume method with delaunay triangulation","volume":"40","author":"li","year":"2010","journal-title":"IEEE Trans Syst Man Cybern B Cybern"},{"key":"ref30","author":"lophaven","year":"2002","journal-title":"DACE a Matlab Kriging Toolbox"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.909792"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837372"},{"key":"ref11","first-page":"754","article-title":"An efficient, fully nonlinear, variability-aware non-Monte-Carlo yield estimation procedure with applications to SRAM cells and ring oscillators","author":"gu","year":"2008","journal-title":"Proc Asia South Pacific Design Autom Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405720"},{"key":"ref13","first-page":"751","article-title":"A fast analog circuit yield estimation method for medium and high dimensional problems","author":"liu","year":"2012","journal-title":"Proc DATE Exhib Conf"},{"key":"ref14","first-page":"1","article-title":"Parametric yield estimation for SRAM cells: Concepts, algorithms and challenges","author":"gong","year":"2010","journal-title":"Proc ACM\/IEEE DAC"},{"key":"ref15","author":"papoulis","year":"2001","journal-title":"Probability Random Variables and Stochastic Processe"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2016633"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1561\/1000000008"},{"key":"ref18","author":"fishman","year":"2005","journal-title":"A First Course in Monte Carlo"},{"key":"ref19","article-title":"Variation-aware custom IC design: Improving PVT and Monte Carlo analysis for design performance and parametric yield","author":"mcconaghy","year":"2011","journal-title":"Solido White Paper"},{"key":"ref28","first-page":"1","article-title":"Global optimization of integrated transformers for high frequency microwave circuits using a Gaussian process based surrogate model","author":"liu","year":"2011","journal-title":"Proc DATE Exhib Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024769"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2008.02.017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611970081"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref29","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-3799-8","author":"santner","year":"2003","journal-title":"The Design and Analysis of Computer Experiments"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2160916.2160926"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2219070"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2209884"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2231429"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.267"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1142\/9789812774736"},{"key":"ref21","author":"surhone","year":"2010","journal-title":"Radial Basis Function Network"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429420"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364490"},{"key":"ref26","author":"sun","year":"2011","journal-title":"Particle Swarm Optimisation Classical and Quantum Perspectives"},{"key":"ref25","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0577-0","author":"man","year":"1999","journal-title":"Genetic Algorithms Concepts and Designs"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6740003\/06740007.pdf?arnumber=6740007","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:33Z","timestamp":1642005093000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6740007\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":34,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2013.2292504","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,3]]}}}