{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:59:54Z","timestamp":1740131994336,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["2083.001"],"award-info":[{"award-number":["2083.001"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/tcad.2014.2302384","type":"journal-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T18:04:52Z","timestamp":1400263492000},"page":"853-866","source":"Crossref","is-referenced-by-count":11,"title":["Dynamic On-Chip Thermal Sensor Calibration Using Performance Counters"],"prefix":"10.1109","volume":"33","author":[{"given":"Shiting Justin","family":"Lu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Russell","family":"Tessier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wayne","family":"Burleson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"ref33"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364517"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250700"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2043964"},{"key":"ref10","first-page":"817","article-title":"A general framework for spatial correlation modeling in VLSI design","author":"liu","year":"0","journal-title":"Proc IEEE\/ACM Design Autom Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630037"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228475"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228476"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907062"},{"key":"ref15","first-page":"232","article-title":"Using performance counters for runtime temperature sensing in high-performance processors","author":"lee","year":"0","journal-title":"Proc IEEE Int Parallel Distrib Process Symp"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061310"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798264"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2051567"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"472","DOI":"10.1145\/1629911.1630036","article-title":"accurate temperature estimation using noisy thermal sensors","author":"yufu zhang","year":"2009","journal-title":"2009 46th ACM\/IEEE Design Automation Conference dac"},{"journal-title":"Applied multivariate statistical analysis[M]","year":"2007","author":"johnson","key":"ref28"},{"key":"ref4","first-page":"487","article-title":"On process variation tolerant low cost thermal sensor design in 32 nm CMOS technology","author":"remarsu","year":"0","journal-title":"Proc ACM Great Lakes Symp VLSI"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"7:1","DOI":"10.1145\/2390191.2390198","article-title":"Thermal prediction and adaptive control through workload phase detection","volume":"18","author":"cochran","year":"2013","journal-title":"ACM Trans Des Autom Electron Syst"},{"key":"ref3","first-page":"20","article-title":"Power management architecture of the 2nd generation Intel core microarchitecture, formerly codenamed Sandy Bridge","volume":"32","author":"rotem","year":"0","journal-title":"Proc Hot Chips"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837293"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/941360.941362"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.885064"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2158275"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/STHERM.2012.6188870"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2011.2114250"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450535"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2001.903261"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429388"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1109\/ISCA.1995.524546","article-title":"The SPLASH-2 programs: characterization and methodological considerations","author":"woo","year":"1995","journal-title":"Proceedings 22nd Annual International Symposium on Computer Architecture ISCA"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147053"},{"year":"0","key":"ref24"},{"journal-title":"SESC Simulator","year":"2005","author":"renau","key":"ref23"},{"key":"ref26","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4612-0745-0","author":"neal","year":"1996","journal-title":"Bayesian learning for neural networks"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1992.4.3.415"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6816010\/06817679.pdf?arnumber=6817679","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T05:47:00Z","timestamp":1689227220000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6817679\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":33,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2014.2302384","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2014,6]]}}}