{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T15:37:02Z","timestamp":1775489822632,"version":"3.50.1"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2015,7,1]],"date-time":"2015-07-01T00:00:00Z","timestamp":1435708800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"National Science Foundation through the NCN-NEEDS program, contract 1227020-EEC"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/tcad.2015.2415492","type":"journal-article","created":{"date-parts":[[2015,3,23]],"date-time":"2015-03-23T18:34:59Z","timestamp":1427135699000},"page":"1082-1095","source":"Crossref","is-referenced-by-count":42,"title":["Rapid Co-Optimization of Processing and Circuit Design to Overcome Carbon Nanotube Variations"],"prefix":"10.1109","volume":"34","author":[{"given":"Gage","family":"Hills","sequence":"first","affiliation":[]},{"family":"Jie Zhang","sequence":"additional","affiliation":[]},{"given":"Max Marcel","family":"Shulaker","sequence":"additional","affiliation":[]},{"family":"Hai Wei","sequence":"additional","affiliation":[]},{"family":"Chi-Shuen Lee","sequence":"additional","affiliation":[]},{"given":"Arjun","family":"Balasingam","sequence":"additional","affiliation":[]},{"given":"H.-S Philip","family":"Wong","sequence":"additional","affiliation":[]},{"given":"Subhasish","family":"Mitra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1038\/nature12502"},{"key":"ref38","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-82118-9","author":"shor","year":"1985","journal-title":"Minimization Methods for Non-Differentiable Functions"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2076323"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424295"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2016562"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2003278"},{"key":"ref37","doi-asserted-by":"crossref","DOI":"10.1142\/p080","author":"saito","year":"1998","journal-title":"Physical Properties of Carbon Nanotubes"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923255"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2010604"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.901882"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.189"},{"key":"ref27","year":"2011","journal-title":"OpenSPARC"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.carbon.2012.06.049"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2052231"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2006.52"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.77"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1983.1052035"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2024022"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.831796"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2258023"},{"key":"ref26","first-page":"569","article-title":"High performance CMOS variability in the 65 nm regime and beyond","author":"nassif","year":"2007","journal-title":"Proc IEEE Int Electron Devices Meeting (IEDM)"},{"key":"ref25","year":"2014","journal-title":"Nangate open cell library"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2023197"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837497"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2187527"},{"key":"ref53","article-title":"Variation-aware design of carbon nanotube digital VLSI circuits","author":"zhang","year":"2011"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131490"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050511"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1682"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2282092"},{"key":"ref12","year":"2012","journal-title":"Eigen C++ template library for linear algebra"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/nl203701g"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/10618600.1992.10477010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/54.785838"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488864"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2415492"},{"key":"ref18","year":"2013","journal-title":"ITRS"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2013.56"},{"key":"ref4","author":"budiman","year":"2014","journal-title":"Cylindrical CNTMOSFET Simulator"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1006\/jath.1994.1136"},{"key":"ref6","article-title":"IEDM short course","author":"chang","year":"2012","journal-title":"Proc Int Electron Device Meeting (IEDM)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature07110"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382665"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"1735","DOI":"10.1126\/science.1122797","article-title":"An integrated logic circuit assembled on a single carbon nanotube","volume":"311","author":"chen","year":"2006","journal-title":"Science"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629933"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373592"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424281"},{"key":"ref45","year":"2015","journal-title":"Stanford University VSCNFET Model"},{"key":"ref48","author":"weste","year":"2005","journal-title":"CMOS VLSI Design"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724663"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047120"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1021\/nn406301r"},{"key":"ref44","first-page":"15","article-title":"Design benchmarking to 7 nm with FinFET predictive technology models","author":"sinha","year":"2012","journal-title":"Proc ACM\/IEEE Int Symp Low Power Electron Design (ISLPED)"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047164"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7124553\/07065286.pdf?arnumber=7065286","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:47:04Z","timestamp":1642006024000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7065286\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":54,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2015.2415492","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,7]]}}}