{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T03:13:30Z","timestamp":1761621210842},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2015,10,1]],"date-time":"2015-10-01T00:00:00Z","timestamp":1443657600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"German Research Foundation (DFG) as part of the National Focal Program \u201cDependable Embedded Systems\u201d (SPP-1500,)"},{"DOI":"10.13039\/100015463","name":"Karlsruhe House of Young Scientists","doi-asserted-by":"crossref","id":[{"id":"10.13039\/100015463","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/tcad.2015.2422845","type":"journal-article","created":{"date-parts":[[2015,4,14]],"date-time":"2015-04-14T18:38:11Z","timestamp":1429036691000},"page":"1586-1599","source":"Crossref","is-referenced-by-count":50,"title":["Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor"],"prefix":"10.1109","volume":"34","author":[{"given":"Mojtaba","family":"Ebrahimi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adrian","family":"Evans","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enrico","family":"Costenaro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dan","family":"Alexandrescu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vikas","family":"Chandra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Razi","family":"Seyyedi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2015312"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"ref31","first-page":"1","article-title":"SimPoint 3.0: Faster and more flexible program phase analysis","volume":"7","author":"hamerly","year":"2005","journal-title":"Instruction-Level Parallelism"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2006.22"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090694"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5103-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558932"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488858"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784485"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.47"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2123918"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488683"},{"key":"ref16","first-page":"1","article-title":"Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales","author":"ebrahimi","year":"2014","journal-title":"Proc Design Autom Test Europe Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5385-9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.262"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5365-0"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36234"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref27","first-page":"3","article-title":"MiBench: A free, commercially representative embedded benchmark suite","author":"guthaus","year":"2001","journal-title":"Proc IEEE Int Workshop Workload Character"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2171993"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.07.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173251"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2034314"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2005.1493087"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784522"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2031972"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2047907"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548935"},{"key":"ref21","first-page":"1","article-title":"Towards a hierarchical and scalable approach for modeling the effects of SETs","author":"costenaro","year":"2013","journal-title":"Proc 2nd Workshop Silicon Errors Logic-Syst Effects (SELSE)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.01.002"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.831993"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993833"},{"key":"ref25","year":"2015","journal-title":"Jedec89c"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7271134\/07086043.pdf?arnumber=7086043","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:37Z","timestamp":1642003357000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7086043\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":35,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2015.2422845","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,10]]}}}