{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T23:49:11Z","timestamp":1783036151872,"version":"3.54.6"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-1116171"],"award-info":[{"award-number":["CNS-1116171"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1217947"],"award-info":[{"award-number":["CCF-1217947"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/tcad.2015.2474366","type":"journal-article","created":{"date-parts":[[2015,8,28]],"date-time":"2015-08-28T18:56:04Z","timestamp":1440788164000},"page":"380-393","source":"Crossref","is-referenced-by-count":36,"title":["Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach"],"prefix":"10.1109","volume":"35","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8424-7040","authenticated-orcid":false,"given":"Jianlei","family":"Yang","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Peiyuan","family":"Wang","sequence":"additional","affiliation":[{"name":"Qualcomm Research, San Diego, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yaojun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanqing","family":"Cheng","sequence":"additional","affiliation":[{"name":"Department of Electronic and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weisheng","family":"Zhao","sequence":"additional","affiliation":[{"name":"Department of Electronic and Information Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiran","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hai Helen","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","year":"2011","journal-title":"GPDK General 45nm Salicide 1 0V\/1 8V 1P 11M Process Design Kit"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593196"},{"key":"ref31","author":"figueiredo","year":"2009","journal-title":"Offset Reduction Techniques in High-Speed Analog-to-Digital Converters Analysis Design and Tradeoffs"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2088143"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2014003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/47\/40\/405003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2195677"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2014.2357054"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2178416"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378282"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.62.570"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.39.6995"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.367094"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.92.088302"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-0534(1996)8:2<77::AID-CMR1>3.0.CO;2-L"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2027907"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.035"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2239671"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798259"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105333"},{"key":"ref29","author":"zhao","year":"2015","journal-title":"SPINLIB Spintronics Nanodevice SPICE-Compatible Compact Model Library"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993623"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.853696"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429541"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2153838"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2370735"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424242"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/38\/18\/001"},{"key":"ref22","year":"2015","journal-title":"Predictive Technology Model (PTM)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref24","article-title":"Ionizing radiation effects in electronic devices and circuits","author":"ratti","year":"2013"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6993-4_2"},{"key":"ref26","year":"2015","journal-title":"ATLAS 3D Device Simulator SILVACO International"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.869826"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7419205\/07229278.pdf?arnumber=7229278","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,4]],"date-time":"2024-06-04T20:43:46Z","timestamp":1717533826000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7229278\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":34,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2015.2474366","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,3]]}}}