{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:12Z","timestamp":1740132012629,"version":"3.37.3"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2016,9,1]],"date-time":"2016-09-01T00:00:00Z","timestamp":1472688000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003968","name":"Iran National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003968","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/tcad.2015.2511148","type":"journal-article","created":{"date-parts":[[2015,12,22]],"date-time":"2015-12-22T14:13:22Z","timestamp":1450793602000},"page":"1503-1508","source":"Crossref","is-referenced-by-count":17,"title":["All-Region Statistical Model for Delay Variation Based on Log-Skew-Normal Distribution"],"prefix":"10.1109","volume":"35","author":[{"given":"Hadi","family":"Ahmadi Balef","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehdi","family":"Kamal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ali","family":"Afzali-Kusha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Massoud","family":"Pedram","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/jlpea3030233"},{"journal-title":"Nangate open cell library","year":"2014","key":"ref11"},{"journal-title":"Predictive Technology Model","year":"2014","key":"ref12"},{"journal-title":"The Skew-Normal and Related Families","year":"2014","author":"azzalini","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862751"},{"journal-title":"The Skew-Normal and Skew-t Distributions Package","year":"2014","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2124477"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282316"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061553"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2199499"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5573\/JSTS.2014.14.1.008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2184377"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852164"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2012.6263951"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7547335\/07362143.pdf?arnumber=7362143","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:48:48Z","timestamp":1641988128000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7362143\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":15,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2015.2511148","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2016,9]]}}}