{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:55:10Z","timestamp":1760597710257,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2016]]},"DOI":"10.1109\/tcad.2016.2586444","type":"journal-article","created":{"date-parts":[[2016,6,30]],"date-time":"2016-06-30T16:14:37Z","timestamp":1467303277000},"page":"1-1","source":"Crossref","is-referenced-by-count":11,"title":["Reliability Analysis of Multiple-Outputs Logic Circuits based on Structure Function Approach"],"prefix":"10.1109","author":[{"given":"Miroslav","family":"Kvassay","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9087-0311","authenticated-orcid":false,"given":"Elena","family":"Zaitseva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vitaly","family":"Levashenko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jozef","family":"Kostolny","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1137\/0107041"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(94)90026-4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2008.12.001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1134\/S000511791302001X"},{"journal-title":"Reliability of Computer Systems and Networks Fault Tolerance Analysis and Design","year":"2002","author":"shooman","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.10.016"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(86)90725-0"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.809656"},{"journal-title":"Logic Synthesis and Optimization Benchmarks User Guide Version 3 0","year":"1991","author":"yang","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/24.9870"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882592"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2003.1181907"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898719758"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.816397"},{"key":"ref7","first-page":"44","article-title":"Reliability analysis of logic network with multiple outputs","volume":"17","author":"zaitseva","year":"2015","journal-title":"Commun Sci Lett Univ Zilina"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2012530"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.03.011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/9781118314593"},{"journal-title":"IWLS’93 Benchmark Set Version 4 0 Distributed as a Part of IWLS’93 Benchmark Set","year":"1993","author":"mcelvain","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jal.2013.05.005"},{"journal-title":"Benchmarks of Ripple-Carry Adders Generated","year":"0","author":"fi\u0161er","key":"ref21"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/6917053\/07502171.pdf?arnumber=7502171","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:38:10Z","timestamp":1641987490000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7502171\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2586444","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2016]]}}}