{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,27]],"date-time":"2026-09-27T03:40:04Z","timestamp":1790480404209,"version":"4.1.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Singapore A*STAR Graduate Scholarship"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tcad.2016.2611499","type":"journal-article","created":{"date-parts":[[2016,9,20]],"date-time":"2016-09-20T18:22:56Z","timestamp":1474395776000},"page":"1288-1297","source":"Crossref","is-referenced-by-count":17,"title":["Improving Diagnostic Resolution of Failing ICs Through Learning"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1721-4120","authenticated-orcid":false,"given":"Yang","family":"Xue","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6108-2925","authenticated-orcid":false,"given":"Ronald D.","family":"Blanton","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041767"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178587"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.41"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2196278"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894285"},{"key":"ref16","first-page":"1","article-title":"Diagnostic test generation for arbitrary faults","author":"bhatti","year":"2006","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699231"},{"key":"ref18","first-page":"902","article-title":"Machine learning-based volume diagnosis","author":"wang","year":"2009","journal-title":"Proc Design Automat Test Europe Conf Exhib"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116280"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1997.628897"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-2404-4_19"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-4919-2_11"},{"key":"ref6","first-page":"1","article-title":"Test effectiveness evaluation through analysis of readily-available tester data","author":"y -t","year":"2009","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref29","first-page":"363","article-title":"Core vector machines: Fast SVM training on very large data sets","volume":"6","author":"tsang","year":"2005","journal-title":"J Mach Learn Res"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391568"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529877"},{"key":"ref7","first-page":"1","article-title":"Estimating defect-type distributions through volume diagnosis and defect behavior attribution","author":"yu","year":"2009","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529892"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/54.32421"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297627"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138758"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651899"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691104"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"107","DOI":"10.1007\/11731139_15","article-title":"Boosting prediction accuracy on imbalanced datasets with SVM ensembles","author":"liu","year":"2006","journal-title":"Advances in Knowledge Discovery and Data Mining"},{"key":"ref23","year":"2005","journal-title":"Encounter™ User Guide"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/34.574797"},{"key":"ref25","article-title":"Generalized Fisher score for feature selection","author":"gu","year":"2011","journal-title":"arXiv 1202 3725 [cs LG]"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8360974\/07572150.pdf?arnumber=7572150","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T07:25:41Z","timestamp":1643181941000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7572150\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":29,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2611499","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}