{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:22Z","timestamp":1740132022741,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tcad.2016.2618859","type":"journal-article","created":{"date-parts":[[2016,10,19]],"date-time":"2016-10-19T14:16:19Z","timestamp":1476886579000},"page":"1215-1225","source":"Crossref","is-referenced-by-count":2,"title":["Identifying Biases of a Defect Diagnosis Procedure"],"prefix":"10.1109","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5491-7282","authenticated-orcid":false,"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.841070"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.41"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-9442-5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.10"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391568"},{"key":"ref16","first-page":"1","article-title":"An effective and flexible multiple defect diagnosis methodology using error propagation analysis","author":"yu","year":"2008","journal-title":"Proc Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.44"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2009164"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2048352"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766661"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1557\/PROC-674-U3.4","article-title":"On improving the accuracy of multiple defect diagnosis","author":"huang","year":"2001","journal-title":"Proc VLSI Test Symp"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240895"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041767"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743308"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1995","author":"abramovici","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1260966"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.25"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2013.0104"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2014.22"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2358936"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024824"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7951135\/07593309.pdf?arnumber=7593309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:40:47Z","timestamp":1641987647000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7593309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":24,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2618859","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}