{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:22Z","timestamp":1740132022948,"version":"3.37.3"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1320263"],"award-info":[{"award-number":["CCF-1320263"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tcad.2016.2622622","type":"journal-article","created":{"date-parts":[[2016,10,27]],"date-time":"2016-10-27T18:12:16Z","timestamp":1477591936000},"page":"1231-1235","source":"Crossref","is-referenced-by-count":2,"title":["Clock Sequences for Increasing the Fault Coverage of Functional Test Sequences"],"prefix":"10.1109","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5491-7282","authenticated-orcid":false,"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2699853"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1991.206393"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297674"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.18"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.12"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907229"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187567"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700586"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116259"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401550"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556969"},{"journal-title":"Hardware Design Verification Simulation and Formal Method-Based Approaches","year":"2008","author":"lam","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138771"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/43\/7951135\/7723879-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7951135\/07723879.pdf?arnumber=7723879","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:47:48Z","timestamp":1649443668000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7723879\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":15,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2622622","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}