{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T01:56:18Z","timestamp":1785376578657,"version":"3.55.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2017,8,1]],"date-time":"2017-08-01T00:00:00Z","timestamp":1501545600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000196","name":"Canada Foundation for Innovation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000196","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004261","name":"Research and Development Corporation of Newfoundland and Labrador (through its Industrial Research and Innovation Fund and ArcticTECH Research and Development Award)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004261","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005616","name":"Memorial University of Newfoundland","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100005616","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/tcad.2016.2626437","type":"journal-article","created":{"date-parts":[[2016,11,8]],"date-time":"2016-11-08T14:21:47Z","timestamp":1478614907000},"page":"1395-1405","source":"Crossref","is-referenced-by-count":15,"title":["Process-Variation-Aware Rule-Based Optical Proximity Correction for Analog Layout Migration"],"prefix":"10.1109","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7574-0543","authenticated-orcid":false,"given":"Xuan","family":"Dong","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lihong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","first-page":"50","article-title":"Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node","author":"choi","year":"2008","journal-title":"Proc Eur Solid-State Circuits Conf"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-2269-3"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1117\/12.829714"},{"key":"ref30","year":"2016","journal-title":"Mentor Graphics calibre"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"1591","DOI":"10.7873\/DATE.2015.1045","article-title":"A Robust Approach for Process Variation Aware Mask Optimization","author":"jian kuang","year":"2015","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860989"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.19"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.32"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681617"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593163"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001357"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2334492"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/12.897779"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169102"},{"key":"ref28","article-title":"Formation mechanism of 193nm immersion defects and defect reduction strategies","volume":"6923","author":"wei","year":"2008","journal-title":"Proc SPIE"},{"key":"ref4","first-page":"81","article-title":"An efficient rule-based OPC approach using a DRC tool for $0.18~\\mu $ m ASIC","author":"park","year":"2000","journal-title":"Proc Int Symp Quality Electronic Design"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CSTIC.2016.7463982"},{"key":"ref3","first-page":"283","article-title":"Doppler: DPL-aware and OPC-friendly gridless detailed routing with mask density balancing","author":"lin","year":"2011","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413120"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICASIC.2001.982496"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147108"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882604"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2032360"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654341"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.commatsci.2008.04.031"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9780470723876"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527477"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.93"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2459041"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2010.09.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/9780470618943"},{"key":"ref26","article-title":"Managing lithographic variations in design, reliability, and test using statistical techniques","author":"sreedhar","year":"2011"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917594"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/7982827\/07738428.pdf?arnumber=7738428","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:41:35Z","timestamp":1641987695000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7738428\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":33,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2626437","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,8]]}}}