{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:23Z","timestamp":1740132023622,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2017,9,1]],"date-time":"2017-09-01T00:00:00Z","timestamp":1504224000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003662","name":"Korea Evaluation Institute of Industrial Technology","doi-asserted-by":"publisher","award":["10052716"],"award-info":[{"award-number":["10052716"]}],"id":[{"id":"10.13039\/501100003662","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2015M3D1A1070465","2016R1A2B4015329"],"award-info":[{"award-number":["2015M3D1A1070465","2016R1A2B4015329"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/tcad.2016.2629446","type":"journal-article","created":{"date-parts":[[2016,11,16]],"date-time":"2016-11-16T16:39:47Z","timestamp":1479314387000},"page":"1511-1521","source":"Crossref","is-referenced-by-count":3,"title":["Improved Perturbation Vector Generation Method for Accurate SRAM Yield Estimation"],"prefix":"10.1109","volume":"36","author":[{"given":"Woong","family":"Choi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4631-7412","authenticated-orcid":false,"given":"Jongsun","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"journal-title":"BSIM4 8 0 Models","year":"2013","key":"ref11"},{"journal-title":"Digital Integrated Circuits A Design Perspective","year":"2013","author":"rabaey","key":"ref12"},{"journal-title":"Nanoscale Integration and Modeling (NIMO) Group","year":"2012","key":"ref13"},{"key":"ref14","first-page":"438","author":"ghahramani","year":"2000","journal-title":"Fundamentals of Probability"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2362842"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2589118"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2209884"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2404895"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2020721"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2005.1497065"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6606-3_5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883344"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8013181\/07745960.pdf?arnumber=7745960","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:41:17Z","timestamp":1641987677000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7745960\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":16,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2016.2629446","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2017,9]]}}}