{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T17:51:52Z","timestamp":1767117112705,"version":"3.37.3"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["CCF-1525486"],"award-info":[{"award-number":["CCF-1525486"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/tcad.2017.2717705","type":"journal-article","created":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T18:27:27Z","timestamp":1497983247000},"page":"643-656","source":"Crossref","is-referenced-by-count":6,"title":["A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9354-3447","authenticated-orcid":false,"given":"Marco","family":"Donato","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R. Iris","family":"Bahar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"William R.","family":"Patterson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Zaslavsky","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2007.891263"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228414"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763183"},{"article-title":"Nanoscale CMOS modeling","year":"2008","author":"dunga","key":"ref32"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.96325"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2180604"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2013.2260816"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.4795717"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2313086"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024796"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.884352"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2274152"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2184145"},{"journal-title":"ITRS Executive Summary","year":"2013","key":"ref12"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"90","DOI":"10.1145\/1013235.1013265","article-title":"Characterizing and Modeling Minimum Energy Operation for Subthreshold Circuits","author":"calhoun","year":"2004","journal-title":"Proceedings of the 2004 International Symposium on Low Power Electronics and Design LPE"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5118319"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228572"},{"key":"ref16","first-page":"144","article-title":"End of Moore’s law: Thermal (noise) death of integration in micro and nano electronics","volume":"305","author":"kish","year":"2002","journal-title":"Phys Lett A Gen Atomic Solid State Phys"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2009.5166255"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2376985"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.07.011"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-12616-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.897148"},{"journal-title":"Fundamentals of Modern VLSI Devices","year":"2013","author":"taur","key":"ref27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.887832"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2240699"},{"key":"ref29","first-page":"1","article-title":"A model for soft errors in the subthreshold CMOS inverter","author":"li","year":"2006","journal-title":"Proc SELSE"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.916877"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297681"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.100"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2005.4365566"},{"key":"ref9","first-page":"502","article-title":"Soft error reduction in combinational logic using gate resizing and flipflop selection","author":"rao","year":"2006","journal-title":"Proc ICCAD"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"journal-title":"Eigen V3","year":"2010","author":"guennebaud","key":"ref46"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654254"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-21738-3"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/4.766813"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897960"},{"key":"ref47","first-page":"1","article-title":"Parallel SmartSpice: Fast and accurate circuit simulation finally available","volume":"8","year":"1997","journal-title":"Simul Stand"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/101.261888"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.11.007"},{"key":"ref24","first-page":"1","article-title":"Novel redundant logic design for noisy low voltage scenarios","author":"garc\u00eda-leyva","year":"2013","journal-title":"Proceedings of lSCAS"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2008.09.018"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2206781.2206792"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2742066"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065706"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1063\/1.1506941"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/460312"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/43\/8293876\/7954053-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8293876\/07954053.pdf?arnumber=7954053","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,29]],"date-time":"2022-07-29T22:08:44Z","timestamp":1659132524000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7954053\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":48,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2017.2717705","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2018,3]]}}}