{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T00:00:47Z","timestamp":1780444847501,"version":"3.54.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2018,7,1]],"date-time":"2018-07-01T00:00:00Z","timestamp":1530403200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea Grant","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korea Government (MSIP)","award":["2015R1A2A1A13001751"],"award-info":[{"award-number":["2015R1A2A1A13001751"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/tcad.2017.2760505","type":"journal-article","created":{"date-parts":[[2017,10,6]],"date-time":"2017-10-06T18:34:05Z","timestamp":1507314845000},"page":"1473-1482","source":"Crossref","is-referenced-by-count":24,"title":["Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis"],"prefix":"10.1109","volume":"37","author":[{"given":"Hayoung","family":"Lee","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0641-774X","authenticated-orcid":false,"given":"Kiwon","family":"Cho","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Donghyun","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7093-2095","authenticated-orcid":false,"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","first-page":"33","article-title":"RAMSES-D: DRAM fault simulator supporting weighted coupling fault","author":"hsing","year":"2007","journal-title":"Proc IEEE Int Workshop Memory Technol Design Test"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.5573\/JSTS.2012.12.3.266"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2015.7085465"},{"key":"ref12","first-page":"175","article-title":"Defect analysis system speeds test and repair of redundant memories","volume":"57","author":"tarr","year":"1984","journal-title":"Electronics"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1986.1586118"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874942"},{"key":"ref15","first-page":"478","article-title":"A fast redundancy analysis algorithm in ATE for repairing faulty memories","volume":"34","author":"cho","year":"2012","journal-title":"ETRI J"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.13.0112.0467"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6165054"},{"key":"ref18","first-page":"1","article-title":"Efficient test and repair architectures for 3D TSV-based random access memories","author":"lu","year":"2013","journal-title":"Proc 4th Int Symp VLSI Design"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2015.2455347"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/92.285750"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.10"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/66.97808"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.821925"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2005988"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250090"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.10.0210.0032"},{"key":"ref8","first-page":"2174","article-title":"Optimized built-in self-repair for multiple memories","volume":"24","author":"kang","year":"2016","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062830"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894250"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2288637"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387367"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"222","DOI":"10.1109\/TCAD.1987.1270266","article-title":"On the repair of redundant RAM’s","volume":"6","author":"wey","year":"1987","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/74382.74510"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/12.73586"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299251"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.19"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1975.1050655"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.28"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8387697\/08060577.pdf?arnumber=8060577","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:22:49Z","timestamp":1642004569000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8060577\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":30,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2017.2760505","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,7]]}}}