{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T15:19:59Z","timestamp":1774365599919,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Research Grants Council of Hong Kong","award":["CUHK24209017"],"award-info":[{"award-number":["CUHK24209017"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tcad.2018.2837078","type":"journal-article","created":{"date-parts":[[2018,5,16]],"date-time":"2018-05-16T19:04:47Z","timestamp":1526497487000},"page":"1175-1187","source":"Crossref","is-referenced-by-count":84,"title":["Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning"],"prefix":"10.1109","volume":"38","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4709-0061","authenticated-orcid":false,"given":"Haoyu","family":"Yang","sequence":"first","affiliation":[]},{"given":"Jing","family":"Su","sequence":"additional","affiliation":[]},{"given":"Yi","family":"Zou","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3612-4182","authenticated-orcid":false,"given":"Yuzhe","family":"Ma","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6406-4810","authenticated-orcid":false,"given":"Bei","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Evangeline F. Y.","family":"Young","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","first-page":"633","article-title":"Smooth boosting and learning with malicious noise","volume":"4","author":"servedio","year":"2003","journal-title":"J Mach Learn Res"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-59119-2_166"},{"key":"ref31","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2015","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref30","first-page":"265","article-title":"TensorFlow: A system for large-scale machine learning","author":"abadi","year":"2016","journal-title":"Proc of the 2nd USENIX Symp on Operating Systems Design and Implementation (OSDI)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429457"},{"key":"ref11","article-title":"Optical proximity correction with hierarchical Bayes model","volume":"9426","author":"matsunawa","year":"2015","journal-title":"Proc SPIE"},{"key":"ref12","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc Conf Neural Inf Process Syst (NIPS)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.140"},{"key":"ref14","article-title":"Automatic layout feature extraction for lithography hotspot detection based on deep neural network","volume":"9781","author":"matsunawa","year":"2016","journal-title":"Proc SPIE Adv Lithography"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/1.JMM.15.4.043507"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/1.JMM.16.3.033504"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/1.JMM.16.3.033504"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2017.8226047"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062270"},{"key":"ref28","article-title":"Theory of deep learning III: Generalization properties of SGD","author":"zhang","year":"2017"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2387858"},{"key":"ref27","first-page":"1","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2015","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2638440"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967032"},{"key":"ref29","first-page":"2847","article-title":"On the expressive power of deep neural networks","author":"raghu","year":"2017","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref5","article-title":"A new lithography hotspot detection framework based on AdaBoost classifier and simplified feature extraction","volume":"9427","author":"matsunawa","year":"2015","journal-title":"Proc SPIE"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6164956"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722294"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228576"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630053"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2351273"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488821"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/30.125072"},{"key":"ref21","article-title":"Synthesis of lithography test patterns through topology-oriented pattern extraction and classification","volume":"9053","author":"shim","year":"2014","journal-title":"Proc SPIE"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/0165-1684(84)90013-6"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"533","DOI":"10.1038\/323533a0","article-title":"Learning representations by back-propagating errors","volume":"323","author":"rumelhart","year":"1986","journal-title":"Nature"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1142\/S0218488598000094"},{"key":"ref25","author":"goodfellow","year":"2016","journal-title":"Deep Learning"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8718432\/08360060.pdf?arnumber=8360060","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:14:52Z","timestamp":1657746892000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8360060\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":33,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2018.2837078","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}