{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:59:56Z","timestamp":1740131996324,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2017R1D1A1B03027911"],"award-info":[{"award-number":["2017R1D1A1B03027911"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"ETRI grant funded by the Korean Government (Development of Core Technologies for Implantable Active Devices)","award":["18ZB1200"],"award-info":[{"award-number":["18ZB1200"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/tcad.2018.2859240","type":"journal-article","created":{"date-parts":[[2018,7,24]],"date-time":"2018-07-24T22:37:59Z","timestamp":1532471879000},"page":"1758-1770","source":"Crossref","is-referenced-by-count":9,"title":["TEI-ULP: Exploiting Body Biasing to Improve the TEI-Aware Ultralow Power Methods"],"prefix":"10.1109","volume":"38","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0600-0004","authenticated-orcid":false,"given":"Woojoo","family":"Lee","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9147-3898","authenticated-orcid":false,"given":"Taewook","family":"Kang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3260-1620","authenticated-orcid":false,"given":"Jae-Jin","family":"Lee","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9151-3447","authenticated-orcid":false,"given":"Kyuseung","family":"Han","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2126-768X","authenticated-orcid":false,"given":"Joongheon","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Massoud","family":"Pedram","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2375335"},{"key":"ref32","first-page":"37","article-title":"A 55nm ultra low leakage deeply depleted channel technology optimized for energy minimization in subthreshold SRAM and logic","author":"patel","year":"2016","journal-title":"Proc Euro Solid-State Device Res Conf (ESSDERC)"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479042"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2333660.2333720"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691125"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2934583.2934631"},{"key":"ref11","first-page":"1","article-title":"Ti-states: Processor power management in the temperature inversion region","author":"zu","year":"2016","journal-title":"Proc 49th Annu IEEE\/ACM Int Symp Microarchit (MICRO)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2017.2762670"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372611"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2666721"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2693269"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.11.015"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/HOTCHIPS.2015.7477469"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"543","DOI":"10.1109\/JSSC.2015.2501985","article-title":"A successive-approximation switched-capacitor DC&#x2013;DC converter with resolution of $\\text{V}_{in}\/2^{n}$ for a wide range of input and output voltages","volume":"51","author":"bang","year":"2016","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808156"},{"key":"ref28","first-page":"868","article-title":"Theoretical and practical limits of dynamic voltage scaling","author":"bo zhai","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2010.5724509"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967039"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654219"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3019941"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1040"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627608"},{"journal-title":"TSMC 40n LP Process Technology","year":"2017","key":"ref8"},{"journal-title":"Predictive Technology Model (PTM)","year":"2017","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2013.10"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1145\/2872334.2878629","article-title":"Design and tool flow of IBM&#x2019;s TrueNorth: An ultra-low power programmable neurosynaptic chip with 1 million neurons","author":"akopyan","year":"2016","journal-title":"Proc Int Symp Phys Design (ISPD)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.43"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.912137"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2295977"},{"key":"ref24","first-page":"1","article-title":"8.4 a 0.33v\/- $40^{\\circ }\\text{C}$ process\/temperature closed-loop compensation SoC embedding all-digital clock multiplier and DC&#x2013;DC converter exploiting FDSOI 28nm back-gate biasing","author":"clerc","year":"2015","journal-title":"IEEE Int Solid State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2159285"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2396998"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2750907"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/43\/8807328\/8418741-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8807328\/08418741.pdf?arnumber=8418741","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,28]],"date-time":"2022-08-28T03:59:32Z","timestamp":1661659172000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8418741\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":34,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2018.2859240","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2019,9]]}}}