{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T19:18:06Z","timestamp":1773861486151,"version":"3.50.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2018YFB10033005"],"award-info":[{"award-number":["2018YFB10033005"]}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["61821003"],"award-info":[{"award-number":["61821003"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["61872413"],"award-info":[{"award-number":["61872413"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["U1709220"],"award-info":[{"award-number":["U1709220"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["61902137"],"award-info":[{"award-number":["61902137"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key-Area Research and Development Program of Guangdong Province","award":["2019B010107001"],"award-info":[{"award-number":["2019B010107001"]}]},{"DOI":"10.13039\/501100017607","name":"Shenzhen Fundamental Research Program","doi-asserted-by":"publisher","award":["JCYJ20170307160135308"],"award-info":[{"award-number":["JCYJ20170307160135308"]}],"id":[{"id":"10.13039\/501100017607","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017607","name":"Shenzhen Fundamental Research Program","doi-asserted-by":"publisher","award":["JCYJ20170818162129916"],"award-info":[{"award-number":["JCYJ20170818162129916"]}],"id":[{"id":"10.13039\/501100017607","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013314","name":"Higher Education Discipline Innovation Project","doi-asserted-by":"publisher","award":["B07038"],"award-info":[{"award-number":["B07038"]}],"id":[{"id":"10.13039\/501100013314","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"Project Funded by China Postdoctoral Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2020,12]]},"DOI":"10.1109\/tcad.2020.2981025","type":"journal-article","created":{"date-parts":[[2020,3,16]],"date-time":"2020-03-16T19:27:37Z","timestamp":1584386857000},"page":"4563-4574","source":"Crossref","is-referenced-by-count":23,"title":["BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction"],"prefix":"10.1109","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8829-408X","authenticated-orcid":false,"given":"Ruixiang","family":"Ma","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9746-4714","authenticated-orcid":false,"given":"Fei","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0061-3475","authenticated-orcid":false,"given":"Zhonghai","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Wenmin","family":"Zhong","sequence":"additional","affiliation":[]},{"given":"Qiulin","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Jiguang","family":"Wan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1271-0571","authenticated-orcid":false,"given":"Changsheng","family":"Xie","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/3078505.3078527"},{"key":"ref38","first-page":"497","article-title":"Probability and statistics for engineering and the sciences","volume":"46","author":"ziegel","year":"2012","journal-title":"Technometrics"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2591513.2591594"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2288691"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2504868"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"ref37","first-page":"226","article-title":"A density-based algorithm for discovering clusters in large spatial databases with noise","author":"ester","year":"1996","journal-title":"Proc ACM Int'l Conf Knowledge Disc Data Mining (KDD)"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1021\/ci034160g"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/0925-2312(91)90023-5"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2018.00064"},{"key":"ref40","year":"2011","journal-title":"Stress-Test-Driven Qualification of Integrated Circuits JESD47E"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2015.7248337"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/EMSOFT.2013.6658584"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176622"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2631919"},{"key":"ref15","first-page":"1","article-title":"Performance and reliability analysis of cross-layer optimizations of nand flash controllers","volume":"14","author":"davide","year":"2015","journal-title":"ACM Trans Embedded Comput Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242066"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939074"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574632"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2015.7208284"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37207-0_22"},{"key":"ref4","first-page":"24","article-title":"Characterizing flash memory: Anomalies, observations, and applications","author":"grupp","year":"2010","journal-title":"Proc IEEE\/ACM Int Symp Microarchit (MICRO)"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CIS.2013.6782154"},{"key":"ref3","first-page":"115","article-title":"Write endurance in flash drives: Measurements and analysis","author":"boboila","year":"2010","journal-title":"Proc USENIX Conf File Storage Technol (FAST)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488936"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2393299"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2210256"},{"key":"ref7","first-page":"47","article-title":"Wear-unleveling: Improving nand flash lifetime by balancing page endurance","author":"jimenez","year":"2014","journal-title":"Proc USENIX Conf File Storage Technol (FAST)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2011.5937225"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2858771"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1244002.1244248"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714941"},{"key":"ref20","first-page":"61","article-title":"Lifetime improvement of nand flash-based storage systems using dynamic program and erase scaling","author":"jeong","year":"2014","journal-title":"Proc USENIX Conf File Storage Technol USENIX Assoc (FAST)"},{"key":"ref45","doi-asserted-by":"crossref","first-page":"1735","DOI":"10.1162\/neco.1997.9.8.1735","article-title":"Long short-term memory","volume":"9","author":"sepp","year":"1997","journal-title":"Neural Comput"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.826871"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2018.00050"},{"key":"ref42","first-page":"11","article-title":"Optimizing nand flash-based SSDs via retention relaxation","author":"liu","year":"2012","journal-title":"Proc USENIX Conf File Storage Technol (FAST)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2011.5873215"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/30\/12\/125006"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909567"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2463372.2463537"},{"key":"ref43","year":"2011","journal-title":"JEDEC Solid State Technology Association Failure Mechanisms and Models for Semiconductor Devices"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2017.8171304"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9265421\/09037364.pdf?arnumber=9037364","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:06:49Z","timestamp":1651068409000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9037364\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12]]},"references-count":46,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2020.2981025","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,12]]}}}