{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:40:50Z","timestamp":1781887250591,"version":"3.54.5"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2020,12]]},"DOI":"10.1109\/tcad.2020.2983127","type":"journal-article","created":{"date-parts":[[2020,3,24]],"date-time":"2020-03-24T22:45:06Z","timestamp":1585089906000},"page":"5032-5041","source":"Crossref","is-referenced-by-count":13,"title":["LEVAX: An Input-Aware Learning-Based Error Model of Voltage-Scaled Functional Units"],"prefix":"10.1109","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4476-2501","authenticated-orcid":false,"given":"Xun","family":"Jiao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1879-4406","authenticated-orcid":false,"given":"Dongning","family":"Ma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4053-8898","authenticated-orcid":false,"given":"Wanli","family":"Chang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0955-503X","authenticated-orcid":false,"given":"Yu","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3196129"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203882"},{"key":"ref11","first-page":"1","article-title":"Workload-and instruction-aware timing analysis—The missing link between technology and system-level resilience","author":"kleeberger","year":"2014","journal-title":"Proc 51st Annu Design Autom Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2012.6237021"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2012.146"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2317180"},{"key":"ref15","first-page":"2825","article-title":"Scikit-learn: Machine learning in python","volume":"12","author":"pedregosa","year":"2011","journal-title":"J Mach Learn Res"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.72"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.342"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228555"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1993316.1993518"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.055"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317908"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155636"},{"key":"ref3","volume":"17","author":"bushnell","year":"2004","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.44"},{"key":"ref29","first-page":"868","article-title":"Theoretical and practical limits of dynamic voltage scaling","author":"bo zhai","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2005.09.012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2150976.2151008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1201\/CRCSIGPROCOM"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.604077"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1806596.1806620"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2038698.2038720"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2678373.2665746"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744778"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2370816.2370865"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744805"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105401"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627613"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9265421\/09046289.pdf?arnumber=9046289","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:06:25Z","timestamp":1651068385000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9046289\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12]]},"references-count":30,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2020.2983127","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,12]]}}}