{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T00:40:25Z","timestamp":1771029625610,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["MOST 108-2634-F-007-009"],"award-info":[{"award-number":["MOST 108-2634-F-007-009"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]},{"name":"United Microelectronics Corporation"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/tcad.2020.3015469","type":"journal-article","created":{"date-parts":[[2020,8,10]],"date-time":"2020-08-10T21:37:20Z","timestamp":1597095440000},"page":"957-970","source":"Crossref","is-referenced-by-count":33,"title":["From IC Layout to Die Photograph: A CNN-Based Data-Driven Approach"],"prefix":"10.1109","volume":"40","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3749-234X","authenticated-orcid":false,"given":"Hao-Chiang","family":"Shao","sequence":"first","affiliation":[]},{"given":"Chao-Yi","family":"Peng","sequence":"additional","affiliation":[]},{"given":"Jun-Rei","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9097-2318","authenticated-orcid":false,"given":"Chia-Wen","family":"Lin","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6675-2676","authenticated-orcid":false,"given":"Shao-Yun","family":"Fang","sequence":"additional","affiliation":[]},{"given":"Pin-Yian","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Yan-Hsiu","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","author":"shao","year":"2020","journal-title":"Contour-To-Contour Distance"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref33","first-page":"234","article-title":"U-Net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Proc Medical Image Comput Comput -Assist Intervent (MICCAI)"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2101613"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2840695"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00071"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2003.1177156"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/0167-2789(92)90242-F"},{"key":"ref35","first-page":"770","article-title":"Discriminative region proposal adversarial networks for high-quality image-to-image translation","author":"wang","year":"2018","journal-title":"Proc Eur Conf Comput Vis"},{"key":"ref34","first-page":"2017","article-title":"Spatial transformer networks","author":"jaderberg","year":"2015","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2007.897275"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2014.05.008"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.891332"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2276751"},{"key":"ref14","first-page":"1","article-title":"Reducing time and effort in IC implementation: A roadmap of challenges and solutions","author":"kahng","year":"2018","journal-title":"Proc ACM\/ESDA\/IEEE Design Autom Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3196056"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3288749"},{"key":"ref17","first-page":"2672","article-title":"Generative adversarial nets","author":"goodfellow","year":"2014","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.632"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00917"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/34.935844"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.13.002187"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1117\/12.474591"},{"key":"ref3","author":"taflove","year":"2005","journal-title":"Computational Electrodynamics The Finite-Difference Time-Domain Method"},{"key":"ref6","article-title":"Optical proximity correction (OPC) method for improving lithography process window","author":"hsu","year":"2001"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref5","first-page":"278","article-title":"Automated optical proximity correction: A rules-based approach","volume":"2197","author":"otto","year":"1994","journal-title":"Proc SPIE Opt \/Laser Microlithogr VIII"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1145\/3197517.3201332","article-title":"Neural best-buddies: Sparse cross-domain correspondence","volume":"37","author":"aberman","year":"2018","journal-title":"ACM Trans Graph"},{"key":"ref7","year":"2020","journal-title":"Synopsys Inc"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317852"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.20"},{"key":"ref1","article-title":"Accurate lithography simulation model based on convolutional neural networks","volume":"10147","author":"watanabe","year":"2017","journal-title":"Proc Opt Microlithography XXX"},{"key":"ref20","first-page":"700","article-title":"Unsupervised image-to-image translation networks","author":"liu","year":"2017","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.244"},{"key":"ref21","author":"kingma","year":"2013","journal-title":"Auto-encoding variational bayes"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.18"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.310"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593163"},{"key":"ref25","first-page":"172","article-title":"Multimodal unsupervised image-to-image translation","author":"huang","year":"2018","journal-title":"Proc Eur Conf Comput Vis"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9409805\/09163418.pdf?arnumber=9163418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:29Z","timestamp":1652194169000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9163418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":39,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2020.3015469","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,5]]}}}