{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:07:30Z","timestamp":1774966050493,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Fundamental Research Foundation of Shenzhen","award":["JCYJ20190808151819049"],"award-info":[{"award-number":["JCYJ20190808151819049"]}]},{"name":"Shenzhen-Hong Kong Joint Innovation Foundation","award":["SGDX20190919094401725"],"award-info":[{"award-number":["SGDX20190919094401725"]}]},{"name":"Kongque Technology Innovation Foundation of Shenzhenunder","award":["KQJSCX20170727101037551"],"award-info":[{"award-number":["KQJSCX20170727101037551"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2021,6]]},"DOI":"10.1109\/tcad.2020.3024884","type":"journal-article","created":{"date-parts":[[2020,9,18]],"date-time":"2020-09-18T20:21:35Z","timestamp":1600460495000},"page":"1172-1182","source":"Crossref","is-referenced-by-count":7,"title":["An All-MOSFET Voltage Reference-Based PUF Featuring Low BER Sensitivity to VT Variations and 163 fJ\/Bit in 180-nm CMOS"],"prefix":"10.1109","volume":"40","author":[{"given":"Peizhou","family":"Gan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9965-3516","authenticated-orcid":false,"given":"Xiaojin","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5227-2241","authenticated-orcid":false,"given":"Yuan","family":"Cao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","article-title":"A statistical test suite for random and pseudorandom number generators for cryptographic applications","author":"rukhin","year":"2010"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2654326"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702721"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2944586"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/WIFS.2012.6412622"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2927758"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST47458.2019.9006709"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351253"},{"key":"ref35","year":"0","journal-title":"Extended temperature device and testing advancements for COMs and SFF SBCs enable reliable long life systems"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2903387"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5955011"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217631"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.094"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855565"},{"key":"ref13","first-page":"1","article-title":"A physically unclonable function with BER <10?? for robust chip authentication using oscillator collapse in 40 nm CMOS","author":"yang","year":"2015","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2729941"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2749226"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2018.8297289"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2855061"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2806041"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2743004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310219"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516717"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2636859"},{"key":"ref3","first-page":"57","article-title":"Reverse engineering flash EEPROM memories using scanning electron microscopy","author":"courbon","year":"2016","journal-title":"Proc Smart Card Res Adv Appl IFIP Conf (CARDIS)"},{"key":"ref6","first-page":"9","article-title":"Physical unclonable function for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"Proc Design Autom Conf (DAC)"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865584"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2014.15"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1200","DOI":"10.1109\/TVLSI.2005.859470","article-title":"Extracting secret keys from integrated circuits","volume":"13","author":"lim","year":"2005","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2017.2713305"},{"key":"ref9","first-page":"1","article-title":"Initial SRAM state as a fingerprint and source of true random numbers for RFID tags","author":"holcomb","year":"2007","journal-title":"Proc Conf RFID Security"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2932022"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2945247"},{"key":"ref24","first-page":"256","article-title":"15 fJ\/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140&#x00D7; inter\/intra PUF hamming distance separation in 65 nm","author":"alvarez","year":"2015","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref23","first-page":"278","article-title":"A 0.19 pJ\/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22 nm CMOS","author":"mathew","year":"2014","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870303"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586498"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9437244\/09200646.pdf?arnumber=9200646","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:30Z","timestamp":1652194170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9200646\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6]]},"references-count":40,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2020.3024884","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,6]]}}}