{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:25:41Z","timestamp":1782969941617,"version":"3.54.5"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["1526405"],"award-info":[{"award-number":["1526405"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["1801495"],"award-info":[{"award-number":["1801495"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000006","name":"Office of Naval Research","doi-asserted-by":"publisher","award":["N00014-18-1-2058"],"award-info":[{"award-number":["N00014-18-1-2058"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]},{"name":"NSF Career Award"},{"DOI":"10.13039\/100012025","name":"New York University\/New York University Abu Dhabi CCS","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100012025","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000006","name":"Office of Naval Research Award","doi-asserted-by":"publisher","award":["N00014-18-1-2058"],"award-info":[{"award-number":["N00014-18-1-2058"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2022,1]]},"DOI":"10.1109\/tcad.2021.3054808","type":"journal-article","created":{"date-parts":[[2021,1,26]],"date-time":"2021-01-26T20:55:45Z","timestamp":1611694545000},"page":"183-195","source":"Crossref","is-referenced-by-count":17,"title":["Robust Deep Learning for IC Test Problems"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5869-1751","authenticated-orcid":false,"given":"Animesh Basak","family":"Chowdhury","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7642-3638","authenticated-orcid":false,"given":"Benjamin","family":"Tan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6158-9512","authenticated-orcid":false,"given":"Siddharth","family":"Garg","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7989-5617","authenticated-orcid":false,"given":"Ramesh","family":"Karri","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758639"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791548"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2019.00054"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.000-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2837078"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2917130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0893-6080(89)90020-8"},{"key":"ref8","first-page":"2847","article-title":"On the expressive power of deep neural networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Raghu"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317838"},{"key":"ref10","volume-title":"Robust physical-world attacks on deep learning models","author":"Eykholt","year":"2017"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3408288"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699231"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928956"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-014-5477-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242071"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-45528-0"},{"key":"ref17","volume-title":"Semi-supervised classification with graph convolutional networks","author":"Kipf","year":"2016"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2287184"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2878169"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2018.8400701"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/widm.1360"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2481859"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791512"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.50"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1186\/1471-2210-10-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.000-5"},{"key":"ref27","first-page":"221","article-title":"On testability analysis of combinational networks","volume-title":"Proc. IEEE Int. Symp. Circuits Syst.","author":"Brglez"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/800139.804528"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266205"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/b117406"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/54.9272"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676183"},{"key":"ref33","first-page":"39","article-title":"The ISCAS\u201985 benchmark circuits and netlist format","volume":"25","author":"Bryan","year":"1985","journal-title":"North Carolina State Univ."},{"key":"ref34","first-page":"1929","article-title":"Notes on the ISCAS\u201989 benchmark circuits","volume-title":"Proc. MCNC","author":"Brglez"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref36","article-title":"The EPFL combinational benchmark suite","volume-title":"Proc. Int. Workshop Logic Synth.","author":"Amar\u00fa"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-14295-6_5"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1002\/0471725382"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2307\/1422689"},{"key":"ref40","volume-title":"BadNets: Identifying vulnerabilities in the machine learning model supply chain","author":"Gu","year":"2017"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3033749"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/43\/9660612\/9336061-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9660612\/09336061.pdf?arnumber=9336061","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:00:00Z","timestamp":1704841200000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9336061\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1]]},"references-count":41,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2021.3054808","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,1]]}}}