{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T01:48:13Z","timestamp":1782784093416,"version":"3.54.5"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002920","name":"Research Grants Council of the Hong Kong SAR","doi-asserted-by":"publisher","award":["CUHK14209320"],"award-info":[{"award-number":["CUHK14209320"]}],"id":[{"id":"10.13039\/501100002920","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/tcad.2021.3109556","type":"journal-article","created":{"date-parts":[[2021,9,1]],"date-time":"2021-09-01T20:18:46Z","timestamp":1630527526000},"page":"2671-2684","source":"Crossref","is-referenced-by-count":33,"title":["Neural-ILT 2.0: Migrating ILT to Domain-Specific and Multitask-Enabled Neural Network"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8163-3114","authenticated-orcid":false,"given":"Bentian","family":"Jiang","sequence":"first","affiliation":[{"name":"Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lixin","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3612-4182","authenticated-orcid":false,"given":"Yuzhe","family":"Ma","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6406-4810","authenticated-orcid":false,"given":"Bei","family":"Yu","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Evangeline F. Y.","family":"Young","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"1591","article-title":"A robust approach for process variation aware mask optimization","volume-title":"Proc. IEEE\/ACM Proc. Design Autom. Test Eurpoe (DATE)","author":"Kuang"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2514082"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763173"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2014.6881379"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/12.2279912"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203763"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.2536632"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/12.846638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/12.2515668"},{"key":"ref10","first-page":"1","article-title":"An efficient layout decomposition approach for triple patterning lithography","volume-title":"Proc. 50th ACM\/EDAC\/IEEE Design Autom. Conf. (DAC)","author":"Kuang"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7427992"},{"key":"ref12","first-page":"1","article-title":"LithoGAN: End-to-end lithography modeling with generative adversarial networks","volume-title":"Proc. ACM\/IEEE Design Autom. Conf. (DAC)","author":"Ye"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2864251"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6164956"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2837078"},{"key":"ref16","first-page":"1","article-title":"Faster region-based hotspot detection","volume-title":"Proc. ACM\/IEEE Design Autom. Conf. (DAC)","author":"Chen"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2016.10.006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465816"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287682"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2620902"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/9780470723876"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691131"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3061494"},{"key":"ref25","volume-title":"NanGate FreePDK45 Generic Open Cell Library","year":"2008"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1117\/12.655904"},{"key":"ref27","first-page":"221","article-title":"Fit: Fill insertion considering timing","volume-title":"Proc. ACM\/IEEE Design Autom. Conf. (DAC)","author":"Jiang"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2939329"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9832686\/09526856.pdf?arnumber=9526856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:40:46Z","timestamp":1705012846000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9526856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":28,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2021.3109556","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}