{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:50Z","timestamp":1740132050832,"version":"3.37.3"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2018YFB2202101"],"award-info":[{"award-number":["2018YFB2202101"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002855","name":"National Science and Technology Major Project of the Ministry of Science and Technology of China","doi-asserted-by":"publisher","award":["2018ZX01027101-002"],"award-info":[{"award-number":["2018ZX01027101-002"]}],"id":[{"id":"10.13039\/501100002855","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62004112"],"award-info":[{"award-number":["62004112"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2019TQ0167"],"award-info":[{"award-number":["2019TQ0167"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/tcad.2021.3112884","type":"journal-article","created":{"date-parts":[[2021,9,20]],"date-time":"2021-09-20T20:28:46Z","timestamp":1632169726000},"page":"2421-2434","source":"Crossref","is-referenced-by-count":5,"title":["Security Oriented Design Framework for EM Side-Channel Protection in RTL Implementations"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1443-9279","authenticated-orcid":false,"given":"Jiaji","family":"He","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7118-9379","authenticated-orcid":false,"given":"Haocheng","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2849-7197","authenticated-orcid":false,"given":"Max","family":"Panoff","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1117-2740","authenticated-orcid":false,"given":"Hanning","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"given":"Yiqiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7548-4116","authenticated-orcid":false,"given":"Leibo","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9896-9407","authenticated-orcid":false,"given":"Xiaolong","family":"Guo","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Kansas State University, Manhattan, KS, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8791-0597","authenticated-orcid":false,"given":"Yier","family":"Jin","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}]}],"member":"263","reference":[{"issue":"4","key":"ref1","first-page":"54","article-title":"Side channel attack survey","volume":"1","author":"Persial","year":"2011","journal-title":"Int. J. Adv. Sci. Res. Rev"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/11545262_21"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/967900.968073"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_26"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71829-3_2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.64"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-42001-6_12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758600"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-020-00233-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045426"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITCC.2004.1286711"},{"article-title":"Leakage assessment methodology\u2014A clear roadmap for side-channel evaluations","year":"2015","author":"Schneider","key":"ref12"},{"key":"ref13","first-page":"1","article-title":"Test vector leakage assessment (TVLA) methodology in practice","volume-title":"Proc. Int. Cryptograph. Module Conf.","author":"Becker"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-68697-5_9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45418-7_17"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44709-1_21"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-19574-7_17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-10838-9_7"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37288-9_17"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-66787-4_20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2018.8383888"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_26"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ReConFig.2013.6732274"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2015.7401714"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CIS.2014.43"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2017.2713323"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-30205-6_50"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465395"},{"key":"ref29","first-page":"403","article-title":"A dynamic and differential CMOS logic with signal independent power consumption to withstand differential power analysis on smart cards","volume-title":"Proc. Eur. Solid-State Circuits Conf.","author":"Tiri"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268856"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2046505"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741026"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8740839"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2005.12.013"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203769"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2727985"},{"key":"ref37","first-page":"21","article-title":"Spectrum analysis of cryptographic modules to counteract side-channel attacks","volume-title":"Proc. EMC","volume":"6","author":"Sugawara"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-43283-0_10"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-75208-2_7"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD50377.2020.00098"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-27954-6_15"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7518-8_19"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85053-3_27"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_30"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978\u20133-540\u201328632-5_2"},{"key":"ref46","first-page":"115","article-title":"A testing methodology for side-channel resistance validation","volume-title":"Proc. NIST Non-Invasive Attack Testing Workshop","volume":"7","author":"Jun"},{"volume-title":"UltraScale Architecture Configurable Logic Block","year":"2017","key":"ref47"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2950380"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST47458.2019.9006705"},{"volume-title":"NIST Document FIPS 197 Based AES Design","year":"2014","key":"ref50"},{"volume-title":"Lookup Tabel Based AES Design","year":"2017","key":"ref51"},{"volume-title":"CEP AES Design","year":"2018","key":"ref52"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9832686\/09540903.pdf?arnumber=9540903","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:17:52Z","timestamp":1705015072000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9540903\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":52,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2021.3112884","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}