{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:13Z","timestamp":1740132013497,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology of Taiwan","doi-asserted-by":"publisher","award":["MOST 108-2628-E-110-004-MY3"],"award-info":[{"award-number":["MOST 108-2628-E-110-004-MY3"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.1109\/tcad.2022.3194811","type":"journal-article","created":{"date-parts":[[2022,7,28]],"date-time":"2022-07-28T19:42:59Z","timestamp":1659037379000},"page":"1323-1335","source":"Crossref","is-referenced-by-count":3,"title":["On Development of Reliable Machine Learning Systems Based on Machine Error Tolerance of Input Images"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7954-5569","authenticated-orcid":false,"given":"Tong-Yu","family":"Hsieh","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"}]},{"given":"Chun-Chao","family":"Cheng","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9495-2907","authenticated-orcid":false,"given":"Wei-Ji","family":"Chao","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"}]},{"given":"Pin-Xuan","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"}]}],"member":"263","reference":[{"key":"ref1","article-title":"YOLOv3: An incremental improvement","author":"Redmon","year":"2018","journal-title":"arXiv:1804.02767"},{"key":"ref2","first-page":"1","article-title":"DRIS-3: Deep neural network reliability improvement scheme in 3D die stacked memory based on fault analysis","volume-title":"Proc. ACM\/IEEE Design Autom. Conf.","author":"Kim"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/VTS.2018.8368656"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ISCA.2016.32"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/CAHPC.2018.8645906"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TPDS.2020.3043449"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/LATW.2019.8704548"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/VTS48691.2020.9107565"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/MDT.2004.8"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ATS.2004.51"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.3390\/electronics9040557"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TIP.2003.819861"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TIP.2011.2109730"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1117\/12.597306"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TBC.2011.2104671"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ISPACS.2014.7024421"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/PCS.2015.7170095"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TCAD.2017.2705050"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/ITC-Asia.2018.00033"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1007\/s11263-009-0275-4"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/TASL.2008.919072"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/ICEMI.2017.8265997"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/30.125072"},{"key":"ref24","article-title":"Yolov4: Optimal speed and accuracy of object detection","author":"Bochkovskiy","year":"2020","journal-title":"arXiv:2004.10934"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.l007\/978-3-319-46448-0_2"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1007\/s11263-015-0816-y"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/ITC44170.2019.9000150"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.micpro.2021.104318"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/TEST.2000.894311"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1145\/3364681"},{"volume-title":"System on Chip Test Architectures","year":"2008","author":"Wang","key":"ref31"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/JETCAS.2019.2910232"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/ISSCC.2017.7870353"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/TCSI.2017.2735490"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10077488\/09844144.pdf?arnumber=9844144","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T09:19:06Z","timestamp":1706779146000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9844144\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":34,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2022.3194811","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2023,4]]}}}