{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T15:58:40Z","timestamp":1781107120552,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100012025","name":"Center for Cyber Security (CCS) at New York University Abu Dhabi","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100012025","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Advantest as part of the Graduate School \u201cIntelligent Methods for Test and Reliability\u201d (GS-IMTR) at the University of Stuttgart"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tcad.2022.3197521","type":"journal-article","created":{"date-parts":[[2022,8,9]],"date-time":"2022-08-09T20:37:03Z","timestamp":1660077423000},"page":"3826-3837","source":"Crossref","is-referenced-by-count":35,"title":["GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9932-6833","authenticated-orcid":false,"given":"Lilas","family":"Alrahis","sequence":"first","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5093-2939","authenticated-orcid":false,"given":"Johann","family":"Knechtel","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0148-0523","authenticated-orcid":false,"given":"Florian","family":"Klemme","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5649-3102","authenticated-orcid":false,"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0782-0397","authenticated-orcid":false,"given":"Ozgur","family":"Sinanoglu","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2121913"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898082"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3069664"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2228305"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.893585"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3110807"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774603"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD51958.2021.9643476"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3113035"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2021.3108487"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9474039"},{"key":"ref12","volume-title":"GNN4REL Datasets.","author":"Alrahis","year":"2022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2790083"},{"key":"ref14","article-title":"How powerful are graph neural networks?","author":"Xu","year":"2018","journal-title":"arXiv:1810.00826"},{"key":"ref15","article-title":"Semi-supervised classification with graph convolutional networks","author":"Kipf","year":"2016","journal-title":"arXiv:1609.02907"},{"key":"ref16","first-page":"1263","article-title":"Neural message passing for quantum chemistry","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Gilmer"},{"key":"ref17","article-title":"Neural execution of graph algorithms","author":"Veli\u010dkovi\u0107","year":"2019","journal-title":"arXiv:1910.10593"},{"key":"ref18","first-page":"13260","article-title":"Principal neighbourhood aggregation for graph nets","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"33","author":"Corso"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2014.7046976"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2990672"},{"key":"ref21","volume-title":"BSIM-CMG 110","author":"Venugopalan","year":"2016"},{"key":"ref22","volume-title":"Silvaco and Si2 Release Unique, Free 15nm Open-Source Digital Cell Library.","year":"2019"},{"key":"ref23","volume-title":"PrimeLib user guide","year":"2022"},{"key":"ref24","volume-title":"Chipyard\u2019s Documentation.","year":"2022"},{"key":"ref25","volume-title":"PULP Plsatform.","year":"2022"},{"key":"ref26","volume-title":"Industrial and Business Forecasting Methods: A Practical Guide to Exponential Smoothing and Curve Fitting","author":"Lewis","year":"1982"},{"key":"ref27","first-page":"1","article-title":"Aadam: A fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput. Aided Design (ICCAD)","author":"Ebrahimipour"},{"key":"ref28","first-page":"1","article-title":"Cell library characterization using machine learning for design technology co-optimization","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput. Aided Design (ICCAD)","author":"Klemme"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9010157"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9928799\/09852805.pdf?arnumber=9852805","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T02:35:13Z","timestamp":1710383713000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9852805\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":29,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2022.3197521","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}