{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T16:36:19Z","timestamp":1772642179340,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002241","name":"Japan Science and Technology Agency","doi-asserted-by":"publisher","award":["No. JPMJER1603"],"award-info":[{"award-number":["No. JPMJER1603"]}],"id":[{"id":"10.13039\/501100002241","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002241","name":"Japan Science and Technology Agency","doi-asserted-by":"publisher","award":["No. JPMJMI20B8"],"award-info":[{"award-number":["No. JPMJMI20B8"]}],"id":[{"id":"10.13039\/501100002241","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["No.JP19H04086"],"award-info":[{"award-number":["No.JP19H04086"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tcad.2022.3197693","type":"journal-article","created":{"date-parts":[[2022,8,9]],"date-time":"2022-08-09T20:37:03Z","timestamp":1660077423000},"page":"4421-4432","source":"Crossref","is-referenced-by-count":11,"title":["Online Reset for Signal Temporal Logic Monitoring"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3854-9846","authenticated-orcid":false,"given":"Zhenya","family":"Zhang","sequence":"first","affiliation":[{"name":"Faculty of Information Science and Electrical Engineering, Kyushu University, Fukuoka, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6253-4062","authenticated-orcid":false,"given":"Paolo","family":"Arcaini","sequence":"additional","affiliation":[{"name":"Information Systems Architecture Science Research Division, National Institute of Informatics, Chiyoda City, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuan","family":"Xie","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlap.2008.08.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-019-00337-w"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-75632-5","volume-title":"Lectures on Runtime Verification\u2013Introductory and Advanced Topics","volume":"10457","author":"Bartocci","year":"2018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-63387-9_17"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-32079-9_10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15297-9_9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-017-0286-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.tcs.2009.06.021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3178126.3178131"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-14295-6_17"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.29007\/xwl1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2562059.2562140"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.29007\/trr1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1977.32"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.entcs.2004.01.029"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-30206-3_12"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-19835-9_21"},{"key":"ref18","first-page":"372","article-title":"Approximation-refinement testing of compute-intensive cyber-physical models: An approach based on system identification","volume-title":"Proc. IEEE\/ACM 42nd Int. Conf. Softw. Eng. (ICSE)","author":"Menghi"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2858463"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3302504.3311800"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-81685-8_29"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-55754-6_24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3013073"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-25540-4_23"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/RTSS.2017.00035"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2017.8206234"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2000799.2000800"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-11164-3_15"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/MEMCOD.2015.7340489"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24953-7_20"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10009-020-00582-z"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942130"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/9928799\/09852778.pdf?arnumber=9852778","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T04:43:21Z","timestamp":1709354601000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9852778\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":32,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2022.3197693","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}