{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T18:52:27Z","timestamp":1769539947902,"version":"3.49.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Institute of Information & Communications Technology Planning & Evaluation"},{"DOI":"10.13039\/501100003621","name":"Korea Government","doi-asserted-by":"publisher","award":["2022-0-00971"],"award-info":[{"award-number":["2022-0-00971"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003052","name":"Next Generation Intelligent Semiconductor Development by the Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["20011074"],"award-info":[{"award-number":["20011074"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education","doi-asserted-by":"publisher","award":["NRF-2020M3F3A2A01082326"],"award-info":[{"award-number":["NRF-2020M3F3A2A01082326"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004358","name":"Samsung Electronics","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2023,10]]},"DOI":"10.1109\/tcad.2023.3240659","type":"journal-article","created":{"date-parts":[[2023,2,6]],"date-time":"2023-02-06T14:05:11Z","timestamp":1675692311000},"page":"3289-3300","source":"Crossref","is-referenced-by-count":3,"title":["CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5498-0030","authenticated-orcid":false,"given":"Thai-Hoang","family":"Nguyen","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6246-6143","authenticated-orcid":false,"given":"Muhammad","family":"Imran","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, School of Electrical Engineering and Computer Science, National University of Sciences and Technology, Islamabad, Pakistan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4700-1900","authenticated-orcid":false,"given":"Jaehyuk","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1502-5353","authenticated-orcid":false,"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering and Department of System Semiconductor Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2010.46"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317742"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1815980"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155658"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.2295825"},{"key":"ref37","first-page":"8024","article-title":"PyTorch: An imperative style, high-performance deep learning library","volume":"32","author":"paszke","year":"2019","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2013.42"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317805"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2927510"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3508352.3549400"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.3009498"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.12"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0092-2"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2021.3068577"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref1","first-page":"1","article-title":"Deep compression: Compressing deep neural networks with pruning, trained quantization and Huffman coding","author":"han","year":"2015","journal-title":"Proc ICLR"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2019.101689"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342272"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897993"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465834"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926952"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126964"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586112"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287707"},{"key":"ref26","article-title":"Quantizing deep convolutional networks for efficient inference: A whitepaper","author":"krishnamoorthi","year":"2018","journal-title":"arXiv 1806 08342"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.668"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858421"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2017.2776980"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062310"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942113"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.mser.2014.06.002"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2974013"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16108-9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1147\/rd.524.0439"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2533298"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10255327\/10038658.pdf?arnumber=10038658","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T05:51:06Z","timestamp":1769493066000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10038658\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10]]},"references-count":39,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2023.3240659","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,10]]}}}