{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T20:30:43Z","timestamp":1771705843037,"version":"3.50.1"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100012025","name":"Global Ph.D. Fellowship at New York University\/New York University Abu Dhabi","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100012025","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tcad.2023.3259300","type":"journal-article","created":{"date-parts":[[2023,3,20]],"date-time":"2023-03-20T17:49:54Z","timestamp":1679334594000},"page":"3571-3584","source":"Crossref","is-referenced-by-count":7,"title":["<i>VIGILANT<\/i>: Vulnerability Detection Tool Against Fault-Injection Attacks for Locking Techniques"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8459-1703","authenticated-orcid":false,"given":"Likhitha","family":"Mankali","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Tandon School of Engineering, New York University, Brooklyn, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8975-2414","authenticated-orcid":false,"given":"Satwik","family":"Patnaik","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Texas A&#x0026;M University, College Station, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1504-2575","authenticated-orcid":false,"given":"Nimisha","family":"Limaye","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Tandon School of Engineering, New York University, Brooklyn, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5093-2939","authenticated-orcid":false,"given":"Johann","family":"Knechtel","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0782-0397","authenticated-orcid":false,"given":"Ozgur","family":"Sinanoglu","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44709-1_21"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2511144"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2021.102471"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2022.3149147"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-68697-5_9"},{"key":"ref36","first-page":"1055","article-title":"Does logic locking work with EDA tools?","author":"han","year":"2021","journal-title":"Proc Usenix Security"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317831"},{"key":"ref30","first-page":"175","article-title":"CAS-lock: A security-corruptibility trade-off resilient logic locking scheme","author":"shakya","year":"2020","journal-title":"Proc IACR Trans Cryptograph Hardw Embedded Syst"},{"key":"ref11","article-title":"In Pursuit of Secure Silicon","author":"leef","year":"2017"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.193"},{"key":"ref10","article-title":"EDA Forms the Basis for Designing Secure Systems","author":"cron","year":"2016"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3400302.3415668"},{"key":"ref2","article-title":"TSMC, Samsung Urge U.S. to Allow Them Into $52 Billion Chip Plan","author":"wu","year":"2022"},{"key":"ref1","year":"2022","journal-title":"7nm vs 10nm vs 14nm Fabrication Process"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45203-4_23"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218600"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2005.862424"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2968898"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PAINE49178.2020.9337734"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2015.19"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3400302.3415646"},{"key":"ref46","article-title":"Breaking Caslock","year":"2022"},{"key":"ref23","article-title":"The Price We Pay for Faults","author":"witteman","year":"2020"},{"key":"ref45","article-title":"Attack Tool and Benchmarks","author":"shamsi","year":"2020"},{"key":"ref26","article-title":"Inspector-Fi","year":"2022"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_1"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3063998"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/11889700_15"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134039"},{"key":"ref42","article-title":"Revisiting Fault Adversary Models&#x2014;Hardware Faults in Theory and Practice","author":"richter-brockmann","year":"2021"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2022.3207361"},{"key":"ref22","first-page":"101","author":"asadizanjani","year":"2021","journal-title":"Electrical Probing Attacks"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/3243734.3278519"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HOST45689.2020.9300258"},{"key":"ref43","first-page":"1","article-title":"Inducing local timing fault through EM injection","author":"ghodrati","year":"2018","journal-title":"Proc IEEE Des Autom Conf"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/SP40001.2021.00029"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1949.tb00928.x"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2801220"},{"key":"ref8","article-title":"A Cross-Layer Framework for Cost-Effective Intellectual Property (IP) Protection","year":"2021"},{"key":"ref7","first-page":"1722","article-title":"RESCUE: Resilient, scalable, high-corruption, compact-key-set locking framework","volume":"19","author":"limaye","year":"2022","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref9","article-title":"AISS: Automatic Implementation of Secure Silicon","author":"leef","year":"2019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2335155"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/B978-075067944-2\/50002-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref5","article-title":"The Theft of Semiconductor Intellectual Property (IP) Is Nothing New. Is it Too Late to Act?","author":"blyler","year":"2021"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3400302.3415667"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10288105\/10076815.pdf?arnumber=10076815","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,8]],"date-time":"2023-11-08T19:03:12Z","timestamp":1699470192000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10076815\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":48,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2023.3259300","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}