{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:57:38Z","timestamp":1772042258076,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Polish Ministry of Education and Science","award":["0312\/SBAD\/8160"],"award-info":[{"award-number":["0312\/SBAD\/8160"]}]},{"name":"Polish Ministry of Education and Science","award":["0312\/SBAD\/8164"],"award-info":[{"award-number":["0312\/SBAD\/8164"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tcad.2023.3261781","type":"journal-article","created":{"date-parts":[[2023,3,24]],"date-time":"2023-03-24T18:26:25Z","timestamp":1679682385000},"page":"4260-4269","source":"Crossref","is-referenced-by-count":6,"title":["X-Masking for Deterministic In-System Tests"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9378-127X","authenticated-orcid":false,"given":"Grzegorz","family":"Mrugalski","sequence":"first","affiliation":[{"name":"Siemens Digital Industries Software, Wilsonville, OR, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2124-447X","authenticated-orcid":false,"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries Software, Wilsonville, OR, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9722-2344","authenticated-orcid":false,"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[{"name":"Faculty of Computing and Telecommunications, Poznań University of Technology, Poznań, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bartosz","family":"W\u0142odarczak","sequence":"additional","affiliation":[{"name":"Faculty of Computing and Telecommunications, Poznań University of Technology, Poznań, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","first-page":"1","article-title":"A hybrid space compactor for adaptive X-handling","author":"maaz","year":"2019","journal-title":"Proc ITC"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401558"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3092421"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.38"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386979"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270902"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837366"},{"key":"ref31","first-page":"855","article-title":"On compacting test responses data containing unknown values","author":"wang","year":"2003","journal-title":"Proc ICCAD"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065614"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2432133"},{"key":"ref33","first-page":"1","article-title":"X-LBIST: X-tolerant logic BIST","author":"wohl","year":"2018","journal-title":"Proc ITC"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898078"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70833"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386981"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033794"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271094"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2459035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00008"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437575"},{"key":"ref19","first-page":"255","article-title":"On output response compression in the presence of unknown output values","author":"pomeranz","year":"2002","journal-title":"Proc DAC"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197640"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"476","DOI":"10.1109\/MDT.2007.177","article-title":"X-tolerant compactor with on-chip registration and signature-based diagnosis","volume":"24","author":"rajski","year":"2007","journal-title":"IEEE Design Test Comput"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907276"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.57"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584076"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2181847"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.81"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863742"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2004589"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437576"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.42"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2945760"},{"key":"ref4","first-page":"1","article-title":"Streaming scan network (SSN): An efficient packetized data network for testing of complex SoCs","author":"c\u00f4t\u00e9","year":"2020","journal-title":"Proc ITC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584077"},{"key":"ref6","article-title":"Silent data corruptions at scale","author":"dattatraya","year":"2021","journal-title":"arXiv 2102 11245"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035550"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10288105\/10080973.pdf?arnumber=10080973","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,8]],"date-time":"2023-11-08T19:01:31Z","timestamp":1699470091000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10080973\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":39,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2023.3261781","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}