{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:59:23Z","timestamp":1780675163573,"version":"3.54.1"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["112-2223-E-001-001"],"award-info":[{"award-number":["112-2223-E-001-001"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["111-2221-E-001-013-MY3"],"award-info":[{"award-number":["111-2221-E-001-013-MY3"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["111-2923-E-002-014-MY3"],"award-info":[{"award-number":["111-2923-E-002-014-MY3"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["112-2927-I-001-508"],"award-info":[{"award-number":["112-2927-I-001-508"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["11-2221-E-002-152-MY3"],"award-info":[{"award-number":["11-2221-E-002-152-MY3"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","award":["112-2221-E-002-160-MY3"],"award-info":[{"award-number":["112-2221-E-002-160-MY3"]}],"id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001869","name":"Academia Sinica","doi-asserted-by":"publisher","award":["AS-IA-111-M01"],"award-info":[{"award-number":["AS-IA-111-M01"]}],"id":[{"id":"10.13039\/501100001869","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tcad.2023.3289328","type":"journal-article","created":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T18:36:03Z","timestamp":1687804563000},"page":"4597-4605","source":"Crossref","is-referenced-by-count":8,"title":["Retention-Aware Read Acceleration Strategy for LDPC-Based NAND Flash Memory"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0919-7252","authenticated-orcid":false,"given":"Tse-Yuan","family":"Wang","sequence":"first","affiliation":[{"name":"Institute of Information Science, Academia Sinica, Taipei, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Che-Wei","family":"Tsao","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Academia Sinica, Taipei, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1282-2111","authenticated-orcid":false,"given":"Yuan-Hao","family":"Chang","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Academia Sinica, Taipei, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1974-0394","authenticated-orcid":false,"given":"Tei-Wei","family":"Kuo","sequence":"additional","affiliation":[{"name":"College of Engineering, City University of Hong Kong, Kowloon Tong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"SNIA IOTTA repository","year":"2007"},{"key":"ref2","volume-title":"MT29F64G08CBAB MLC Nand Flash Memory Feature","year":"2010"},{"key":"ref3","volume-title":"MT29F64G08EBAA TLC NAND Flash Memory Features","year":"2010"},{"key":"ref4","volume-title":"MT29F8G08ABACA SLC NAND Flash Memory Features","year":"2010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.134"},{"key":"ref7","first-page":"858","article-title":"A commitment-based management strategy for the performance and reliability enhancement of flash-memory storage systems","volume-title":"Proc. 46th ACM\/IEEE Design Autom. Conf. (DAC)","author":"Chang"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/863955.863979"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062309"},{"key":"ref10","first-page":"1","article-title":"LaLDPC: Latency-aware LDPC for read performance improvement of solid state drives","volume-title":"Proc. MSST","author":"Du"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1962.1057683"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1508284.1508271"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2366231.2337206"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2002.1010143"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1275986.1275990"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/NAS.2019.8834728"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/18.748992"},{"key":"ref18","first-page":"1","article-title":"New era: New efficient reliability-aware wear leveling for endurance enhancement of flash storage devices","volume-title":"Proc. 50th ACM\/EDAC\/IEEE Design Autom. Conf. (DAC)","author":"Yang"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2011.5937225"},{"key":"ref20","first-page":"1","article-title":"FIOS: A fair, efficient flash I\/O scheduler","volume-title":"Proc. FAST","author":"Park"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SMARTCOMP.2014.7043841"},{"key":"ref22","first-page":"12","article-title":"An LDPC-enabled flash controller in 40nm CMOS","volume-title":"Proc. Flash Memory Summit","author":"Yeo"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10325328\/10163478.pdf?arnumber=10163478","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T11:53:41Z","timestamp":1709294021000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10163478\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":22,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2023.3289328","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}