{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T06:47:00Z","timestamp":1773989220887,"version":"3.50.1"},"reference-count":100,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2024,1]]},"DOI":"10.1109\/tcad.2023.3298698","type":"journal-article","created":{"date-parts":[[2023,7,25]],"date-time":"2023-07-25T17:31:56Z","timestamp":1690306316000},"page":"16-29","source":"Crossref","is-referenced-by-count":14,"title":["Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review"],"prefix":"10.1109","volume":"43","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0480-4607","authenticated-orcid":false,"given":"Sadia","family":"Azam","sequence":"first","affiliation":[{"name":"Department of Computer Science, University of Verona, Verona, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0656-9786","authenticated-orcid":false,"given":"Nicola","family":"Dall\u2019Ora","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Verona, Verona, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9739-6501","authenticated-orcid":false,"given":"Enrico","family":"Fraccaroli","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0980-5238","authenticated-orcid":false,"given":"Renaud","family":"Gillon","sequence":"additional","affiliation":[{"name":"Sydelity B.V., Kruisem, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4404-5791","authenticated-orcid":false,"given":"Franco","family":"Fummi","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Verona, Verona, Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2019.8780332"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000141"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3403\/30320032"},{"key":"ref4","volume-title":"IEEE-SA standards board P2427\/D0.13 draft standard for analog defect modeling and coverage","year":"2019"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.536713"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242079"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/cta.292"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS52668.2021.9417072"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998491"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818741"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250160"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804379"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.11.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2017.01.002"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1186\/s13643-016-0384-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijsu.2010.02.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.10.008"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783780"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CODEC.2015.7893197"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651886"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2000.878266"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5221-z"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840855"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2011.6043397"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893607"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008351601024"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763065"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2001.962506"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176730"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968599"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2184108"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IWV.2001.923153"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2196390"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2001.946663"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2013.6549811"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/43.908473"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.125"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2002.996748"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5401-0"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2014.7035567"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(02)00099-X"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035281"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1188261"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/Radioelek.2014.6828408"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.813957"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2360458"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.809811"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812376"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-015-0565-4"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.818129"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177867"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1023\/B:ALOG.0000024065.22617.5a"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2015.7388584"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-014-0431-9"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268909"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0994"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1329887"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805831"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-6142-5"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.9"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465803"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2616159"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855884"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2016.7520721"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2005.08.002"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-7470-7_19"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-9502-x"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2017.8110133"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437630"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926996"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891373"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/DTIP.2018.8394196"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2007.08.006"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-018-1111-y"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/ICIINFS.2008.4798366"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/NATW.2018.8388861"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/ICMEL.2008.4559309"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/FDL.2018.8524050"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1002\/cta.570"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2018.8368549"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2009.5158688"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-008-5097-8"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2019.8795222"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/ICCIS.2010.101"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1145\/3299874.3317976"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2045556"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2894534"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1109\/ICCMS.2010.138"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131581"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2010.6156601"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.19"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/FDL53530.2021.9568379"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855924"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-12-2012-0364"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1214\/09-AAP595"},{"key":"ref97","volume-title":"Importance sampling for high speed statistical Monte-Carlo simulations","author":"Ter","year":"2007"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2751561"},{"key":"ref99","article-title":"Tessent DefectSim","year":"2022"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1109\/FDL50818.2020.9232932"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/10372473\/10194295.pdf?arnumber=10194295","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T22:35:14Z","timestamp":1733956514000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10194295\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1]]},"references-count":100,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2023.3298698","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,1]]}}}